Patents Assigned to MicrotracBEL Corp.
  • Publication number: 20220364969
    Abstract: A gas adsorption amount measurement device, which is an example of an embodiment of the present invention, comprises at least one sample tube, a reference tube, and a control unit. The control unit is configured to measure, using adsorption gas, reference volumes Vdst,ads of a free space of the sample tube not having a sample and reference volumes Vdref,ads of a free space of the reference tube, respectively and to calculate a gas adsorption amount of the sample using the reference volumes Vdst,ads, Vdref,ads.
    Type: Application
    Filed: August 19, 2020
    Publication date: November 17, 2022
    Applicant: MicrotracBEL Corp.
    Inventor: Kazuyuki NAKAI
  • Patent number: 10190956
    Abstract: This true density measurement device is a device that is used to measure the true density of a sample by a gas phase substitution method, and is provided with: a sample chamber for accommodating the sample, the sample chamber being pressurized through the introduction of an inert gas; and an expansion chamber into which is released the inert gas filling the sample chamber. The expansion chamber under conditions of normal use, is opened and closed by a detachable cover, and the volume thereof is modified by insertion or withdrawal of a volume modification member.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: January 29, 2019
    Assignee: MicrotracBEL Corp.
    Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
  • Patent number: 10180380
    Abstract: This true density measurement device is a device for measuring the true density of a sample by a gas phase substitution method, and is provided with a sample chamber for housing the sample, and a lid for providing closure to an opening of the sample chamber. The lid is a non-rotating lid that is pressed against the rim of the opening to hermetically seal the sample chamber.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: January 15, 2019
    Assignee: MicrotracBEL Corp.
    Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
  • Patent number: 9784637
    Abstract: An adsorption characteristic measuring apparatus is configured to: acquire a unit-time leak pressure value from a pressure increase value of an internal pressure value of a sample tube caused by an non-adsorption gas leaking from the outside of a fitting portion into an inner space of the sample tube; acquire a pressure value at which a temporal change of the internal pressure value of the sample tube assumes an equilibrium state when an adsorption gas present in the reference volume portion is supplied into the sample tube and the sample tube is in a closed state; calculate a pressure value after correction of a real leak pressure value is performed on a measured equilibrium pressure value, as a true equilibrium pressure value, the real leak pressure value being obtained in such a manner that the unit-time leak pressure value is multiplied by a leak time; and calculate an adsorption isotherm.
    Type: Grant
    Filed: October 21, 2015
    Date of Patent: October 10, 2017
    Assignees: National Institute of Advanced Industrial Science and Technology, MicrotracBEL Corp.
    Inventors: Akira Endo, Marie Shimomura, Satoshi Taniguchi, Kazuyuki Nakai, Masayuki Yoshida, Makoto Okawa
  • Patent number: 9645069
    Abstract: An adsorption characteristic measuring apparatus according to the invention supplies a predetermined adsorption gas to a film formed body as a sample accommodated in a sample tube to measure adsorption characteristics. In the inside of the sample tube, a void between an inner wall surface of the sample tube and the sample is filled with a particle-like filler having higher thermal conductivity than the adsorption gas under a measurement pressure. In addition, a glass rod as a dead volume reducing rod, a spacer ring for forming a thermal insulation space between the particle-like filler and the glass rod, and a reflective plate for reflecting radiant heat are disposed.
    Type: Grant
    Filed: September 14, 2015
    Date of Patent: May 9, 2017
    Assignees: Waseda University, MicrotracBEL Corp.
    Inventors: Masahiko Matsukata, Kazuyuki Nakai, Masayuki Yoshida
  • Publication number: 20170030817
    Abstract: This true density measurement device is a device that is used to measure the true density of a sample by a gas phase substitution method, and is provided with: a sample chamber for accommodating the sample, the sample chamber being pressurized through the introduction of an inert gas; and an expansion chamber into which is released the inert gas filling the sample chamber. The expansion chamber under conditions of normal use, is opened and closed by a detachable cover, and the volume thereof is modified by insertion or withdrawal of a volume modification member.
    Type: Application
    Filed: January 22, 2015
    Publication date: February 2, 2017
    Applicant: MicrotracBEL Corp.
    Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
  • Publication number: 20170010196
    Abstract: This true density measurement device is a device for measuring the true density of a sample by a gas phase substitution method, and is provided with a sample chamber for housing the sample, and a lid for providing closure to an opening of the sample chamber. The lid is a non-rotating lid that is pressed against the rim of the opening to hermetically seal the sample chamber.
    Type: Application
    Filed: January 22, 2015
    Publication date: January 12, 2017
    Applicant: MicrotracBEL Corp.
    Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto