Patents Assigned to MicrotracBEL Corp.
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Publication number: 20220364969Abstract: A gas adsorption amount measurement device, which is an example of an embodiment of the present invention, comprises at least one sample tube, a reference tube, and a control unit. The control unit is configured to measure, using adsorption gas, reference volumes Vdst,ads of a free space of the sample tube not having a sample and reference volumes Vdref,ads of a free space of the reference tube, respectively and to calculate a gas adsorption amount of the sample using the reference volumes Vdst,ads, Vdref,ads.Type: ApplicationFiled: August 19, 2020Publication date: November 17, 2022Applicant: MicrotracBEL Corp.Inventor: Kazuyuki NAKAI
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Patent number: 10190956Abstract: This true density measurement device is a device that is used to measure the true density of a sample by a gas phase substitution method, and is provided with: a sample chamber for accommodating the sample, the sample chamber being pressurized through the introduction of an inert gas; and an expansion chamber into which is released the inert gas filling the sample chamber. The expansion chamber under conditions of normal use, is opened and closed by a detachable cover, and the volume thereof is modified by insertion or withdrawal of a volume modification member.Type: GrantFiled: January 22, 2015Date of Patent: January 29, 2019Assignee: MicrotracBEL Corp.Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
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Patent number: 10180380Abstract: This true density measurement device is a device for measuring the true density of a sample by a gas phase substitution method, and is provided with a sample chamber for housing the sample, and a lid for providing closure to an opening of the sample chamber. The lid is a non-rotating lid that is pressed against the rim of the opening to hermetically seal the sample chamber.Type: GrantFiled: January 22, 2015Date of Patent: January 15, 2019Assignee: MicrotracBEL Corp.Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
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Patent number: 9784637Abstract: An adsorption characteristic measuring apparatus is configured to: acquire a unit-time leak pressure value from a pressure increase value of an internal pressure value of a sample tube caused by an non-adsorption gas leaking from the outside of a fitting portion into an inner space of the sample tube; acquire a pressure value at which a temporal change of the internal pressure value of the sample tube assumes an equilibrium state when an adsorption gas present in the reference volume portion is supplied into the sample tube and the sample tube is in a closed state; calculate a pressure value after correction of a real leak pressure value is performed on a measured equilibrium pressure value, as a true equilibrium pressure value, the real leak pressure value being obtained in such a manner that the unit-time leak pressure value is multiplied by a leak time; and calculate an adsorption isotherm.Type: GrantFiled: October 21, 2015Date of Patent: October 10, 2017Assignees: National Institute of Advanced Industrial Science and Technology, MicrotracBEL Corp.Inventors: Akira Endo, Marie Shimomura, Satoshi Taniguchi, Kazuyuki Nakai, Masayuki Yoshida, Makoto Okawa
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Patent number: 9645069Abstract: An adsorption characteristic measuring apparatus according to the invention supplies a predetermined adsorption gas to a film formed body as a sample accommodated in a sample tube to measure adsorption characteristics. In the inside of the sample tube, a void between an inner wall surface of the sample tube and the sample is filled with a particle-like filler having higher thermal conductivity than the adsorption gas under a measurement pressure. In addition, a glass rod as a dead volume reducing rod, a spacer ring for forming a thermal insulation space between the particle-like filler and the glass rod, and a reflective plate for reflecting radiant heat are disposed.Type: GrantFiled: September 14, 2015Date of Patent: May 9, 2017Assignees: Waseda University, MicrotracBEL Corp.Inventors: Masahiko Matsukata, Kazuyuki Nakai, Masayuki Yoshida
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Publication number: 20170030817Abstract: This true density measurement device is a device that is used to measure the true density of a sample by a gas phase substitution method, and is provided with: a sample chamber for accommodating the sample, the sample chamber being pressurized through the introduction of an inert gas; and an expansion chamber into which is released the inert gas filling the sample chamber. The expansion chamber under conditions of normal use, is opened and closed by a detachable cover, and the volume thereof is modified by insertion or withdrawal of a volume modification member.Type: ApplicationFiled: January 22, 2015Publication date: February 2, 2017Applicant: MicrotracBEL Corp.Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto
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Publication number: 20170010196Abstract: This true density measurement device is a device for measuring the true density of a sample by a gas phase substitution method, and is provided with a sample chamber for housing the sample, and a lid for providing closure to an opening of the sample chamber. The lid is a non-rotating lid that is pressed against the rim of the opening to hermetically seal the sample chamber.Type: ApplicationFiled: January 22, 2015Publication date: January 12, 2017Applicant: MicrotracBEL Corp.Inventors: Kazuyuki Nakai, Hiromi Yamazaki, Kaori Nakamura, Takayuki Goumoto