Patents Assigned to Microview Technologies Pte Ltd
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Patent number: 9824432Abstract: A method of inspecting two or more sides of an object is provided. The method includes generating one set of image data of two or more sides of the object, such as by using spherical mirror segments that project all sides of the object onto a single image and generating an X by Y array of image data of the single image. The projection of the image data is then compensated for, such as by identifying inspection processes to locate defects of the object in the projected image data or by converting the image data from the projected inspection coordinates to Cartesian coordinates. Predetermined inspection processes are then performed on the compensated image data, such as by using the inspection processes that are optimized for use with the projected image data or by converting the projected image data into a Cartesian format and using Cartesian image data inspection processes.Type: GrantFiled: July 28, 2014Date of Patent: November 21, 2017Assignee: MICROVIEW TECHNOLOGIES PTE LTDInventors: Victor Vertoprakhov, Wong Soon Wei, Sergey Smorgon
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Patent number: 7684610Abstract: An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than the first image area, such as a larger circle that is defined by the smaller circle of view as it rotates around the center point. The second end remains centered on the center point and provides a viewing area that does not change in dimension. An image data system at the second end of the rotating prism generates image data as the prism rotates so as to generate two or more sets of image data that are contained within the field of view area.Type: GrantFiled: February 26, 2008Date of Patent: March 23, 2010Assignee: Microview Technologies PTE Ltd.Inventors: Soon Wei Wong, Victor Vertoprakhov, WenSen Zhou, Ashedah Binti Jusoh Noor, Tian Poh Yew, Kundapura Paremeshwara Srinivas
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Patent number: 7679758Abstract: A method of optically inspecting a fastener to determine whether it meets two or more dimensional parameters is provided. The method includes using centrifugal force to place the fastener in a predetermined location. Two or more sets of image data of the fastener are generated from two or more corresponding different angles. Fastener pass/fail data is generated using a dimensional requirement associated with each set of image data.Type: GrantFiled: April 29, 2005Date of Patent: March 16, 2010Assignee: Microview Technologies PTE Ltd.Inventors: Wong Su Wei, Victor Vertoprakhov, Zhou Wensen, Noor Ashedah Binti Jusoh, Tian Poh Yew, Ah Kow Chin, Chee Leong Chua
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Patent number: 7340085Abstract: An inspection system is provided. The system includes a rotating prism having a first end and a second end. The first end receives a first image area, such as a circular view, and rotates about a center point so as to cover a field of view area that is larger than the first image area, such as a larger circle that is defined by the smaller circle of view as it rotates around the center point. The second end remains centered on the center point and provides a viewing area that does not change in dimension. An image data system at the second end of the rotating prism generates image data as the prism rotates so as to generate two or more sets of image data that are contained within the field of view area.Type: GrantFiled: September 3, 2003Date of Patent: March 4, 2008Assignee: Microview Technologies Pte Ltd.Inventors: Soon Wei Wong, Victor Vertoprakhov, WenSen Zhou, Ashedah Binti Jusoh Noor, Tian Poh Yew, Kundapura Parameshwara Srinivas
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Patent number: 7292331Abstract: A system for high-speed inspection is provided. The system includes a digital camera focused on an inspection location and generating image data. An array of light emitting diodes generates light beams, and one or two lenses collimate the light beams. The angle of incidence of the collimated light on an item at the inspection location is greater than approximately 50 degrees, such as to avoid flashing which can be created by coating on the inspection item or other surface effects. The collimating lenses have a center hole and the digital camera is focused on the inspection location through the center hole.Type: GrantFiled: March 15, 2005Date of Patent: November 6, 2007Assignee: Microview Technologies Pte LtdInventor: Victor Vertoprakhov