Patents Assigned to MICROWAVE MEASUREMENT SYSTEMS LLC
  • Patent number: 11372037
    Abstract: Embodiments of the present invention may provide an antenna characterization system. The system may include a horn antenna including a waveguide and a horn section with an open end and at least one lens disposed at the open end of the horn antenna, having a focal length. The system may also include a platform to hold an antenna under test (AUT) positioned at substantially distance x from the open end of the horn antenna, wherein x is the sum of the focal length and a far-field distance property of the AUT. The system may further include an analyzer coupled to the horn antenna to measure a radiation pattern and other properties such as EIRP, TRP, EVR and spurious emission of a passive or active AUT.
    Type: Grant
    Filed: July 6, 2020
    Date of Patent: June 28, 2022
    Assignee: Microwave Measurements Systems LLC
    Inventor: Vasundara V Varadan
  • Patent number: 10746774
    Abstract: Embodiments of the present invention may provide an antenna characterization system. The system may include a horn antenna including a waveguide and a horn section with an open end and at least one lens disposed at the open end of the horn antenna, having a focal length. The system may also include a platform to hold an antenna under test (AUT) positioned at substantially distance x from the open end of the horn antenna, wherein x is the sum of the focal length and a far-field distance property of the AUT. The system may further include an analyzer coupled to the horn antenna to measure a radiation pattern and other properties such as EIRP, TRP, EVR and spurious emission of a passive or active AUT.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: August 18, 2020
    Assignee: MICROWAVE MEASUREMENT SYSTEMS LLC
    Inventor: Vasundara V. Varadan