Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

Abstract: This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.

Abstract: A device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200). The device includes at least a sliding element (301) to provide for the relative sliding of the object being tested (200) or of the electromagnetic probe network (100), to move the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which is provided a rotation device (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.

Abstract: This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.

Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.