Patents Assigned to Mierij Meteo B.V.
  • Patent number: 6618536
    Abstract: In at least part of the layers of the integrated optical channel waveguide system, such as cladding layers, a passive light guiding layer and an active light guiding layer, an adiabatic layer thickness transition positioned next to a working zone is used to adapt the waveguide structure in the working zones to individually optimized functionality. In this way, the relative layer thickness values as located in the working area, for example a sensor window, a modulation region and a fiber-chip region, can be individually optimized, for example, for maximal evanescent field sensitivity, for minimal modulation voltage and for efficient coupling of light power without the necessity of the optical layer-thickness values elsewhere in the system having to be adjusted. Incorporated in a Mach-Zehnder interferometer this results in an exceptionally sensitive and reliable sensor. Preferably the channel waveguide system is incorporated in an electronic circuitry in which e.g.
    Type: Grant
    Filed: April 4, 2000
    Date of Patent: September 9, 2003
    Assignee: Mierij Meteo B.V.
    Inventors: Rene Gerrit Heideman, Jan Teunis Jan Ikkink, Paul Vincent Lambeck
  • Patent number: 6035711
    Abstract: The invention provides a device for determining the direction and speed of an air flow, comprising a chip which is provided with two mutually perpendicularly positioned pairs of measuring circuits placed at a distance opposite each other, optionally four heating elements in positions coinciding with the measuring circuits and a control circuit, which chip is fixed onto a substrate, characterized in that the mounting between chip and substrate is substantially homogeneous and preferably effected by gluing. The chip is for instance accommodated in a housing of conducting material. The device can contain in addition to the measuring chip a reference chip without heating elements which is embodied in substantially identical manner and which is shielded from the measuring chip by an insulator.
    Type: Grant
    Filed: April 27, 1998
    Date of Patent: March 14, 2000
    Assignee: Mierij Meteo B.V.
    Inventors: Johan Hendrik Huijsing, Arend Hagedoorn, Bastiaan Willem Van Oudheusden, Huibert Jan Verhoeven