Abstract: Disclosed a measurement system for measuring chip-scale polarizing plates, which projects incident lights respectively having a first polarization direction and a second polarization direction to a plurality of chip-scale polarizing plates on a tested wafer, and uses the intensities of the penetrating lights passing through the chip-scale polarizing plates to calculate the transmittances and extinction ratios of the chip-scale polarizing plates so as to determine whether one or more of the chip-scale polarizing plates are unqualified products, wherein the first polarization direction is perpendicular to the second polarization direction; the first polarization direction is perpendicular or parallel to the polarization direction of the chip-scale polarizing plates. The measurement system and measurement method of the present invention can simultaneously measure a plurality of chip-scale polarizing plates and thus can increase the productivity of chip-scale polarizing plates.

Abstract: A non-intrusive load identification method employs a non-intrusive detection device to detect a total current on the main power line (i.e., power entrance) of a power system to identify the types of primary loads. The non-intrusive load identification method obtains a turned-on time interval when the present load of the primary loads is turned on or a turned-off time interval when the present load of the primary loads is turned off, obtains a transient turned-on current or a transient turned-off current based on the turned-on time interval or the turned-off time interval, and converts the transient turned-on current or the transient turned-off current into the present power feature of the present load, thereby identifying the type of the present load.