Patents Assigned to Mirtec Co., Ltd.
  • Publication number: 20150130925
    Abstract: A contactless component-inspecting apparatus captures, using a camera, images of an object to be inspected that is assembled or mounted during a component assembly process and compares the captured image and a previously inputted image to determine whether the object passes or fails the inspection.
    Type: Application
    Filed: September 26, 2012
    Publication date: May 14, 2015
    Applicant: MIRTEC CO., LTD.
    Inventors: Chan Wha Park, Kwon Kyu Jang, Keun Hyung Kang, Ming Jie Wang, Hyun Jeong Park
  • Publication number: 20140232850
    Abstract: The vision testing device with an enhanced image clarity for determining good or bad of a testing object by photographing a testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to a testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a first camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a plurality of second camera parts placed on a side section of the first camera part; a plurality of grid pattern irradiating parts placed between cameras of the second camera parts; a vision processing unit for reading the image photographed by the first camera part and the second camera parts and determining good or bad of the testing object; a control unit for controlling the stage part, the grid pattern irradiating par
    Type: Application
    Filed: March 8, 2012
    Publication date: August 21, 2014
    Applicant: MIRTEC CO., LTD.
    Inventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
  • Publication number: 20130342677
    Abstract: Provided is a vision testing device using a multigrid pattern for determining good or bad of a testing object by photographing the testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to the testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a center camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a irradiating part placed on a side section of the center camera part; a vision processing unit for reading the image photographed by the center camera part and determining good or bad of the testing object; and a control unit for controlling the stage part, the grid pattern irradiating part, the center camera part, wherein the grid pattern irradiating part irradiates grid patterns having periods of different int
    Type: Application
    Filed: March 8, 2012
    Publication date: December 26, 2013
    Applicant: Mirtec Co. Ltd
    Inventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
  • Publication number: 20130301904
    Abstract: A visual inspection apparatus photographs an inspection object using a camera to determine whether the inspection object is defective, and comprises: a stage part on which an inspection object is seated; a camera part including a lens and an image detection part, wherein the camera part photographs an image of the inspection object; an illumination part for illuminating the inspection object; and a visual processing part that reads the image photographed by the camera part to determine whether the inspection object is defective or not. Within a lateral camera of the camera part, which is slopingly installed with respect to a line perpendicular to a plane on which the inspection object is seated, a surface of the image detection part is slopingly installed at a predetermined angle with respect to a plane perpendicular to a line of connecting a center of the inspection object to a center of the camera lens of the lateral camera.
    Type: Application
    Filed: December 20, 2011
    Publication date: November 14, 2013
    Applicant: MIRTEC CO., LTD
    Inventors: Hyun Yul Lee, Tae Koang Park, Kun Hyung Kang
  • Patent number: 7369644
    Abstract: A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit (3) that lands an inspected object (1) safely thereon and transfers the inspected object (1) to a predetermined position; a light generating unit (5) that is installed below the transfer unit (3) and emits a light having a predetermined wavelength to the inspected object (1); a light amplifying unit (7) that is installed on the opposite side of the light generating unit (5) to convert and amplify a predetermined light that transmits the inspected object (1) into a visible light; an optical unit (9) that optically illuminates the inspected object (1) to create a visual image; and a camera (11) that receives an X-ray image amplified through the light amplifying unit (7) or a visual image by the optical unit (9) to obtain information.
    Type: Grant
    Filed: October 14, 2003
    Date of Patent: May 6, 2008
    Assignee: Mirtec Co., Ltd.
    Inventors: Jong-Won Kim, Dong-Hyun Lee, Seong-Cheol Hong
  • Patent number: 7365837
    Abstract: The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed circuit board; an independent lighting unit for primarily illuminating the printed circuit board; a photographing position control module for changing a reflection angle to required location coordinates of the printed circuit board; a camera for obtaining an image of the printed circuit board; a control unit including a motion controller, a lighting controller, and an to image processor to control the components; and a vision processing unit for reading the image obtained through the camera and judging whether the image is good or bad.
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: April 29, 2008
    Assignee: Mirtec Co., Ltd.
    Inventor: Joon-Young Jeong