Patents Assigned to Mirtec Co., Ltd.
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Publication number: 20150130925Abstract: A contactless component-inspecting apparatus captures, using a camera, images of an object to be inspected that is assembled or mounted during a component assembly process and compares the captured image and a previously inputted image to determine whether the object passes or fails the inspection.Type: ApplicationFiled: September 26, 2012Publication date: May 14, 2015Applicant: MIRTEC CO., LTD.Inventors: Chan Wha Park, Kwon Kyu Jang, Keun Hyung Kang, Ming Jie Wang, Hyun Jeong Park
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Publication number: 20140232850Abstract: The vision testing device with an enhanced image clarity for determining good or bad of a testing object by photographing a testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to a testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a first camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a plurality of second camera parts placed on a side section of the first camera part; a plurality of grid pattern irradiating parts placed between cameras of the second camera parts; a vision processing unit for reading the image photographed by the first camera part and the second camera parts and determining good or bad of the testing object; a control unit for controlling the stage part, the grid pattern irradiating parType: ApplicationFiled: March 8, 2012Publication date: August 21, 2014Applicant: MIRTEC CO., LTD.Inventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
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Publication number: 20130342677Abstract: Provided is a vision testing device using a multigrid pattern for determining good or bad of a testing object by photographing the testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to the testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a center camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a irradiating part placed on a side section of the center camera part; a vision processing unit for reading the image photographed by the center camera part and determining good or bad of the testing object; and a control unit for controlling the stage part, the grid pattern irradiating part, the center camera part, wherein the grid pattern irradiating part irradiates grid patterns having periods of different intType: ApplicationFiled: March 8, 2012Publication date: December 26, 2013Applicant: Mirtec Co. LtdInventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
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Publication number: 20130301904Abstract: A visual inspection apparatus photographs an inspection object using a camera to determine whether the inspection object is defective, and comprises: a stage part on which an inspection object is seated; a camera part including a lens and an image detection part, wherein the camera part photographs an image of the inspection object; an illumination part for illuminating the inspection object; and a visual processing part that reads the image photographed by the camera part to determine whether the inspection object is defective or not. Within a lateral camera of the camera part, which is slopingly installed with respect to a line perpendicular to a plane on which the inspection object is seated, a surface of the image detection part is slopingly installed at a predetermined angle with respect to a plane perpendicular to a line of connecting a center of the inspection object to a center of the camera lens of the lateral camera.Type: ApplicationFiled: December 20, 2011Publication date: November 14, 2013Applicant: MIRTEC CO., LTDInventors: Hyun Yul Lee, Tae Koang Park, Kun Hyung Kang
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Patent number: 7369644Abstract: A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit (3) that lands an inspected object (1) safely thereon and transfers the inspected object (1) to a predetermined position; a light generating unit (5) that is installed below the transfer unit (3) and emits a light having a predetermined wavelength to the inspected object (1); a light amplifying unit (7) that is installed on the opposite side of the light generating unit (5) to convert and amplify a predetermined light that transmits the inspected object (1) into a visible light; an optical unit (9) that optically illuminates the inspected object (1) to create a visual image; and a camera (11) that receives an X-ray image amplified through the light amplifying unit (7) or a visual image by the optical unit (9) to obtain information.Type: GrantFiled: October 14, 2003Date of Patent: May 6, 2008Assignee: Mirtec Co., Ltd.Inventors: Jong-Won Kim, Dong-Hyun Lee, Seong-Cheol Hong
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Patent number: 7365837Abstract: The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed circuit board; an independent lighting unit for primarily illuminating the printed circuit board; a photographing position control module for changing a reflection angle to required location coordinates of the printed circuit board; a camera for obtaining an image of the printed circuit board; a control unit including a motion controller, a lighting controller, and an to image processor to control the components; and a vision processing unit for reading the image obtained through the camera and judging whether the image is good or bad.Type: GrantFiled: September 29, 2003Date of Patent: April 29, 2008Assignee: Mirtec Co., Ltd.Inventor: Joon-Young Jeong