Patents Assigned to Mirtec Co., Ltd.
  • Publication number: 20150130925
    Abstract: A contactless component-inspecting apparatus captures, using a camera, images of an object to be inspected that is assembled or mounted during a component assembly process and compares the captured image and a previously inputted image to determine whether the object passes or fails the inspection.
    Type: Application
    Filed: September 26, 2012
    Publication date: May 14, 2015
    Applicant: MIRTEC CO., LTD.
    Inventors: Chan Wha Park, Kwon Kyu Jang, Keun Hyung Kang, Ming Jie Wang, Hyun Jeong Park
  • Publication number: 20140232850
    Abstract: The vision testing device with an enhanced image clarity for determining good or bad of a testing object by photographing a testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to a testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a first camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a plurality of second camera parts placed on a side section of the first camera part; a plurality of grid pattern irradiating parts placed between cameras of the second camera parts; a vision processing unit for reading the image photographed by the first camera part and the second camera parts and determining good or bad of the testing object; a control unit for controlling the stage part, the grid pattern irradiating par
    Type: Application
    Filed: March 8, 2012
    Publication date: August 21, 2014
    Applicant: MIRTEC CO., LTD.
    Inventors: Chan Wha Park, Sang Min Oh, Sung Hyun Kim, Ja Myoung Koo
  • Patent number: 7369644
    Abstract: A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit (3) that lands an inspected object (1) safely thereon and transfers the inspected object (1) to a predetermined position; a light generating unit (5) that is installed below the transfer unit (3) and emits a light having a predetermined wavelength to the inspected object (1); a light amplifying unit (7) that is installed on the opposite side of the light generating unit (5) to convert and amplify a predetermined light that transmits the inspected object (1) into a visible light; an optical unit (9) that optically illuminates the inspected object (1) to create a visual image; and a camera (11) that receives an X-ray image amplified through the light amplifying unit (7) or a visual image by the optical unit (9) to obtain information.
    Type: Grant
    Filed: October 14, 2003
    Date of Patent: May 6, 2008
    Assignee: Mirtec Co., Ltd.
    Inventors: Jong-Won Kim, Dong-Hyun Lee, Seong-Cheol Hong
  • Patent number: 7365837
    Abstract: The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed circuit board; an independent lighting unit for primarily illuminating the printed circuit board; a photographing position control module for changing a reflection angle to required location coordinates of the printed circuit board; a camera for obtaining an image of the printed circuit board; a control unit including a motion controller, a lighting controller, and an to image processor to control the components; and a vision processing unit for reading the image obtained through the camera and judging whether the image is good or bad.
    Type: Grant
    Filed: September 29, 2003
    Date of Patent: April 29, 2008
    Assignee: Mirtec Co., Ltd.
    Inventor: Joon-Young Jeong