Abstract: An irradiation system includes a radiation source for providing a radiation beam at a controlled power level. A product location system provides product so that the radiation beam impinges on the product. A sensor system measures an intensity of the radiation beam that passes through the product, and a control system adjusts the power level of the radiation beam based on the intensity of the radiation beam that passes through the product.
Type:
Grant
Filed:
October 10, 2000
Date of Patent:
March 30, 2004
Assignee:
Mitec, Inc.
Inventors:
Stan V. Lyons, Steven E. Koenck, Brian T. Dalziel, Janette J. Kewley