Patents Assigned to Modec International LLC
  • Patent number: 7452162
    Abstract: A method and system for attaching a TLP to its tendons using pull-down lines to rapidly submerge the hull to installation draft while compensating for inherent hull instability during submergence and to provide motion arrest and aid in station keeping. The system includes tensioning devices mounted on the TLP, usually one for each tendon. Each tensioning device is equipped with a pull-down line which is connected to the corresponding tendon. The TLP hull is submerged to lock-off draft by applying tensions to the pull-down lines connected to the top of the tensions, or by a combination of applying tensions to the pull-down lines and ballasting the hull. As the tensioners take in pull-down line, the hull submerges, i.e. the draft increases.
    Type: Grant
    Filed: May 4, 2006
    Date of Patent: November 18, 2008
    Assignees: Modec International, LLC, Sea Engineering Associates
    Inventors: Pieter G. Wybro, Shukai Wu, Johannes J. Treu, David E. Chaplin
  • Patent number: 7044685
    Abstract: A method and system for attaching a TLP to its tendons using pull-down lines to rapidly submerge the hull to installation draft while compensating for inherent hull instability during submergence and to provide motion arrest and aid in station keeping. The system includes tensioning devices mounted on the TLP, usually one for each tendon. Each tensioning device is equipped with a pull-down line which is connected to the corresponding tendon. The TLP hull is submerged to lock-off draft by applying tensions to the pull-down lines connected to the top of the tensions, or by a combination of applying tensions to the pull-down lines and ballasting the hull. As the tensioners take in pull-down line, the hull submerges, i.e. the draft increases.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: May 16, 2006
    Assignees: Modec International LLC, Sea Engineering Associates, Inc.
    Inventors: Pieter G. Wybro, Shukai Wu, Johannes J. Treu, David E. Chaplin