Patents Assigned to Modulation Instruments
  • Method of characterizing a device under test
    Patent number: 6230106
    Abstract: A method of characterizing a device under test involves the steps of first inserting a calibration standard in a test setup. Second, a calibration signal is applied to the test setup. Third, a number of vector error correction coefficients are determined. Fourth, the device under test is inserted in the test setup. Fifth, a non-sinusoidal signal is applied to the test setup. Sixth, a response to the non-sinusoidal signal is measured.
    Type: Grant
    Filed: October 13, 1999
    Date of Patent: May 8, 2001
    Assignee: Modulation Instruments
    Inventor: Donald William Metzger