Patents Assigned to Molecular Imaging Systems
  • Scanning force microscope with beam tracking lens
    Patent number: 5440920
    Abstract: An atomic force, scanning probe microscope (AFM or SPM) having a stationary-sample stage and a scanning cantilever using an optical lever method with an S-shape PZT is described. The cantilever tip is translated to measure surface profiles while a simple lens attached to the cantilever holder guides a focused beam from a fixed collimated diode laser. This enables the change of scanners or scanning techniques in air or solution without disturbing the sample. The imaging capability is demonstrated up to 100.times.100 square micrometers.
    Type: Grant
    Filed: February 3, 1994
    Date of Patent: August 15, 1995
    Assignee: Molecular Imaging Systems
    Inventors: Pan S. Jung, Daphna R. Yaniv