Patents Assigned to Molecular Imaging Systems
  • Publication number: 20030015666
    Abstract: A multiple target array for receiving particles from a particle beam generator includes a particle beam transport path having a transport inlet and a transport outlet, the inlet receiving a particle beam from the particle beam generator. A kicker magnet is positioned along the particle beam transport path. The kicker magnet has an ON state and an OFF state and a kicker magnet inlet and a kicker magnet outlet. The array further includes a plurality of target paths, each of said target paths having a target inlet and terminating in a target. One of the target inlets is connected to the transport path adjacent to the kicker magnet outlet, and the particle beam in the transport path entering the kicker magnet inlet passes along the transport path through the kicker magnet outlet when the kicker magnet is in the OFF state, and the beam is directed to the target inlet when the kicker magnet is in the ON state.
    Type: Application
    Filed: July 8, 2002
    Publication date: January 23, 2003
    Applicant: Advanced Molecular Imaging Systems, Inc.
    Inventors: Ira Lon Morgan, Floyd Del McDaniel, Pierre Grande, Jerry M. Watson
  • Patent number: 6444990
    Abstract: A multiple target array for receiving particles from a particle beam generator includes a particle beam transport path having a transport inlet and a transport outlet, the inlet receiving a particle beam from the particle beam generator. A kicker magnet is positioned along the particle beam transport path. The kicker magnet has an ON state and an OFF state and a kicker magnet inlet and a kicker magnet outlet. The array further includes a plurality of target paths, each of said target paths having a target inlet and terminating in a target. One of the target inlets is connected to the transport path adjacent to the kicker magnet outlet, and the particle beam in the transport path entering the kicker magnet inlet passes along the transport path through the kicker magnet outlet when the kicker magnet is in the OFF state, and the beam is directed to the target inlet when the kicker magnet is in the ON state.
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: September 3, 2002
    Assignee: Advanced Molecular Imaging Systems, Inc.
    Inventors: Ira Lon Morgan, Floyd Del McDaniel, Pierre Grande, Jerry M. Watson
  • Patent number: 5440920
    Abstract: An atomic force, scanning probe microscope (AFM or SPM) having a stationary-sample stage and a scanning cantilever using an optical lever method with an S-shape PZT is described. The cantilever tip is translated to measure surface profiles while a simple lens attached to the cantilever holder guides a focused beam from a fixed collimated diode laser. This enables the change of scanners or scanning techniques in air or solution without disturbing the sample. The imaging capability is demonstrated up to 100.times.100 square micrometers.
    Type: Grant
    Filed: February 3, 1994
    Date of Patent: August 15, 1995
    Assignee: Molecular Imaging Systems
    Inventors: Pan S. Jung, Daphna R. Yaniv