Patents Assigned to Montech Pty, Ltd
  • Patent number: 5816096
    Abstract: A calibration frame for a non-contact measurement system includes a frame structure (12); a plurality of targets (14) which may be light emitting diodes supported by the frame structure for viewing by the measurement system; control means for activating each of the targets for allowing the targets to be identified by the measurement system; memory means for storing data relating to the position of each target; and a communication link such as an infrared link for transferring data from the calibration frame to the measurement system which relates to the position of that target.
    Type: Grant
    Filed: May 5, 1997
    Date of Patent: October 6, 1998
    Assignees: Southwal Pty, Ltd, Montech Pty, Ltd
    Inventors: Kim Chew Ng, Kemal Ajay