Abstract: A software testing system and method provides full reuse of software tests and associated test data in a centralized shared repository, including enabling the full reuse of test assets including test actions, test scenarios, test data; and automation scripts. Reusable test components consisting of test steps and the type of test data needed by those test steps, are managed and maintained. These components are assembled into reusable components with no binding of test data until execution time, thereby treating the test data as a reusable asset. A reusable test is initially defined using only an indication of a type or category of data, and not bound to the actual data itself, until it is assembled into an executable immediately prior to automated or manual test execution.

Abstract: A software testing system and method provides full reuse of software tests and associated test data in a centralized shared repository, including enabling the full reuse of test assets including test actions, test scenarios, test data; and automation scripts. Reusable test components consisting of test steps and the type of test data needed by those test steps, are managed and maintained. These components are assembled into reusable components with no binding of test data until execution time, thereby treating the test data as a reusable asset. A reusable test is initially defined using only an indication of a type or category of data, and not bound to the actual data itself, until it is assembled into an executable immediately prior to automated or manual test execution.

Abstract: A low cost, lightweight, fast, dense and reliable extended integration semiconductor structure is provided by forming a thin film multilayer wiring decal on a support substrate and aligning and attaching one or more integrated chips to the decal. A support ring is attached to the decal surrounding the aligned and attached integrated substrate, and the support substrate is removed. Reach-through vias connect the decal wiring to the chips.