Abstract: In association with a burn-in system for the accelerated life testing of semiconductor devices, of the type including a burn-in driver universally reconfigurable by computer control, a computer software system and method combining interactive systems for designing projects having data for reconfiguring the driver, designing test sequences having data for controlling semiconductor burn-in, designing oven chamber and driver and burn-in board configurations for use in burn-in control, controlling burn-in testing, diagnosing hardware problems, and providing system security. The software system of a multi-purpose computer controlled driver system functions with and controls the burn-in system hardware to accomplish the signal conditioning and testing during the same time period of a wide variety of devices quickly and efficiently with a minimum of system setups and change-overs.

Abstract: An improved driver system and method therefor for the accelerated life testing of semiconductor devices is described in which a universal burn-in driver system which can be reconfigured by computer control is used to accomplish the efficient signal conditioning, testing and data collection for a wide variety of semiconductor devices with a minimum of system setups and change-overs. The ability of the driver system to be reconfigured by computer control allows at least one group of electronic devices of the same type and at least another group of electronic devices of a different type to be tested by the same burn-in driver without the necessity for mechanical change-over or the use of separate different driver board designs.