Abstract: An image projection system includes one or more wire grid polarizing beam splitters and one or more transmissive arrays. A polarized light beams from a light source and pre-polarizer is directed towards the transmissive array which modulates the polarization of the polarized light beam by selectively altering the polarization of the polarized light beam to encode image information thereon and creating a modulated beam. The modulated beam is directed towards the wire grid polarizing beam splitter which acts as an analyzer to separate the modulated beam into reflected and transmitted beams. A screen is disposed in one of the reflected or transmitted beams to display the encoded image information. The polarizing beam splitter is oriented at an angle with respect to the modulated beam such that the reflected beam is directed away from the transmissive array. A plurality of transmissive arrays can be used for different colors. One or more polarizing beam splitters can act as both analyzers and combiners.
Type:
Application
Filed:
September 9, 2002
Publication date:
April 17, 2003
Applicant:
Moxtek, Inc.
Inventors:
Douglas P. Hansen, Raymond T. Perkins, Eric Gardner
Abstract: A mobile, miniature x-ray source includes a low-power consumption cathode element for mobility, and an anode optic creating a field free region to prolong the life of the cathode element. An electric field is applied to an anode and a cathode that are disposed on opposite sides of an evacuated tube. The anode includes a target material to produce x-rays in response to impact of electrons. The cathode includes a cathode element to produce electrons that are accelerated towards the anode in response to the electric field between the anode and the cathode. The tube can have a length less than approximately 3 inches, and a diameter or width less than approximately 1 inch. The cathode element can include a low-power consumption cathode element with a low power consumption less than approximately 1 watt. The power source can include a battery power source. A field-free region can be positioned at the anode to resist positive ion acceleration back towards the cathode element.
Type:
Application
Filed:
July 29, 2002
Publication date:
January 30, 2003
Applicant:
Moxtek, Inc.
Inventors:
Clark Turner, Arturo Reyes, Hans K. Pew, Mark W. Lund, Michael Lines, Paul Moody, Sergei Voronov
Abstract: A sample support for holding for samples for use with an analysis instrument. The sample support is particularly beneficial for use with analysis instruments which rely on a beam of radiation or accelerated particles and a method for making the same is disclosed. The holder includes a frame with one or more orifices covered by a support surface, typically in the form of a thin polymer film. The film is divided into hydrophobic and hydrophilic portions to isolate precise positions where samples can be placed to intersect a probe beam during analysis.
Type:
Grant
Filed:
March 14, 1997
Date of Patent:
September 28, 1999
Assignee:
Moxtek, Inc.
Inventors:
D. Clark Turner, Arthur A. Robbins, Alisa A. Wilson
Abstract: A holder for micro-samples for use with an analysis instrument relying on a beam of radiation or accelerated particles and a method for making the same is disclosed. The holder includes a frame with one or more orifices covered by a thin polymer film. One or more concave impressions are formed in the thin polymer film at the precise positions where samples can be placed to intersect a probe beam during analysis.
Type:
Grant
Filed:
October 28, 1994
Date of Patent:
August 6, 1996
Assignee:
Moxtek, Inc.
Inventors:
D. Clark Turner, Andrew J. Nielsen, Raymond T. Perkins, Michael Madden
Abstract: X-ray dispersive and reflective structures utilizing special materials which exhibit improved performance in the specific ranges of interest. The structures are formed of alternating thin layers of uranium, uranium compound or uranium alloy and another spacer material consisting of elements or compounds with low absorptance chosen to match the wavelength of interest. These low index of refraction elements or compounds are those best suited for water window microscopy and nitrogen analysis, or are similar elements or compounds best suited for carbon analysis, boron analysis, and x-ray lithography. The structures are constructed using standard thin layer deposition techniques such as evaporation, sputtering, and CVD, or by novel methods which allow thinner and smoother layers to be deposited.
Abstract: X-ray wave diffraction devices are constructed using atomic layer epetaxy. A crystalline substrate is prepared with one or more surface areas on which multiple pairs of layers of material are to be deposited. These layers are then formed by atomic layer epetaxy on the surface areas of the substrate, one on top of another, with the material of each layer of each pair being selected to have a different index of refraction from that of the material of the other layer of each pair. The layers are formed so that the thickness of each layer of a pair is substantially the same as that of the corresponding layer of every other pair and so that x-ray waves impinging on the layers may be reflected therefrom. Layer pairs having a thickness of about 20 angstroms or less are formed on the substrate.
Type:
Grant
Filed:
December 9, 1993
Date of Patent:
October 17, 1995
Assignee:
Moxtek, Inc.
Inventors:
James M. Thorne, James K. Shurtleff, David D. Allred, Raymond T. Perkins