Abstract: A method and apparatus for routing a telephone call through a telephone network from a caller to a called party designated by the caller via advertising service apparatus that operates in two modes successively, the parties being in communication with each other in one mode and ads are selected from storage during that mode and the ads are impressed on one or both of the parties during a different mode. Selection of ad messages for use is controlled by many criteria. Delivery of ad is recorded for accounting purposes. The modes may alternate between message intervals whose duration is determined by ad message length and communication intervals whose length is determined by a talking time timer.

Abstract: The disclosed mercury probe has a mercury reservoir and one or more passages extending from the reservoir to an aperture plate for engaging a test wafer. Dross that tends to form at the wafer-contact end of the mercury passage(s) is removed by returning all of the mercury in the passage(s) into the reservoir, where the dross is captured. Means is provided to introduce air into the passage(s) between the reservoir and the aperture(s) of the aperture plate, for disconnecting the mercury-probe segment(s) of the mercury from the reservoir and, where there are plural mercury-probe segments, for disconnecting them from each other.

Abstract: The disclosed mercury probe has one or more mercury reservoirs and one or more passages extending from the reservoir(s) to an aperture plate for engaging a test wafer. Dross that tends to form at the wafer-contact end of the mercury passage(s) is removed by returning all of the mercury in the passage(s) into the reservoir, where the dross is captured. Means is provided to introduce electrical insulation between the reservoir(s) and the aperture(s) of the aperture plate, for disconnecting the mercury probe segment(s) of the mercury from the reservoir(s) and, where there are plural mercury probe segments, for disconnecting them from each other and from their reservoir(s).

Abstract: The disclosed mercury probe has a mercury reservoir and one or more passages extending from the reservoir to an aperture plate for engaging a test wafer. Dross that tends to form at the wafer-contact end of the mercury passage(s) is removed by returning all of the mercury in the passage(s) into the reservoir, where the dross is captured. Means is provided to introduce air into the passage(s) between the reservoir and the aperture(s) of the aperture plate, for disconnecting the mercury-probe segment(s) of the mercury from the reservoir and, where there are plural mercury-probe segments, for disconnecting them from each other.

Abstract: The described apparatus includes a member of insulation containing a reservoir of mercury and a passage from a side of the reservoir to a contact aperture in a flat face of the member that engages a test wafer, the contact aperture being below the upper surface of the reservoir by a vertical distance limited to cause automatic return to the reservoir of mercury filling the passage when both ends of the passage are at atmospheric pressure. The length of the passage greatly exceeds said vertical distance.

Abstract: The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.

Abstract: The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.