Patents Assigned to Multiscale Technologies, Inc.
  • Method for Measuring Dimensions Relative to Bounded Object
    Publication number: 20230042608
    Abstract: A method for analyzing at least one bounded object in an electron microscope image that includes segmenting the image to provide a segmented image and measuring a dimension relative to the at least one bounded object in the segmented image. The electron microscope image can be an image of a semiconductor device that includes a pattern of bounded objects or structure of the semiconductor device.
    Type: Application
    Filed: August 3, 2022
    Publication date: February 9, 2023
    Applicant: Multiscale Technologies, Inc.
    Inventors: Srinivasa R Kalidindi, Hyung Nun Kim, Almambet Iskakov