Patents Assigned to MURATA MANUFACTRURING CO., LTD.
  • Measurement device and feature measurement method of object to be measured employing same
    Patent number: 9075006
    Abstract: A measurement device that includes a device main unit including at least one cavity for accommodating an analyte containing a specimen and an aperture array structure including a plurality of apertures extending therethrough in a direction perpendicular to a principal surface thereof. The aperture array structure is fixed such that part or all of the aperture array structure is positioned in the cavity.
    Type: Grant
    Filed: March 6, 2014
    Date of Patent: July 7, 2015
    Assignee: MURATA MANUFACTRURING CO., LTD.
    Inventors: Takashi Kondo, Seiji Kamba