Patents Assigned to Nambition GmbH
  • Patent number: 8291511
    Abstract: Proposed is a procedure for carrying out a scanning probe microscopic or atomic force spectroscopic measurement within predetermined parameters, which said procedure encompasses the following steps: a determination of a value variance of at least one of the parameters, and control of an adjustment member in relation to said variance, so that the variance is at least partially compensated for.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: October 16, 2012
    Assignee: Nambition GmbH
    Inventors: Leif Riemenschneider, Gerd Hoffmann
  • Patent number: 7810166
    Abstract: The invention relates to a device for scanning probe microscopy, said device comprising a scanning microscopy measuring device provided with a measuring probe for scanning microscopy measurements and a sample carrier for receiving a sample to be measured by scanning microscopy; a control device which is connected to the scanning microscopy measuring device in such a way that it is integrated into the system, and is designed in such a way as to automatically control the measuring device in order to perform a scanning microscopy measurement according to pre-defined control parameters; and/or an evaluation device that is connected to the scanning microscopy measuring device in such a way that it is integrated into the system, and is designed in such a way as to automatically evaluate measurements according to pre-defined evaluation parameters.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: October 5, 2010
    Assignee: Nambition GmbH
    Inventors: Jens Struckmeier, Karl Schlagenhauf
  • Publication number: 20100146673
    Abstract: Proposed is a procedure for carrying out a scanning probe microscopic or atomic force spectroscopic measurement within predetermined parameters, which said procedure encompasses the following steps: a determination of a value variance of at least one of the parameters, and control of an adjustment member in relation to said variance, so that the variance is at least partially compensated for.
    Type: Application
    Filed: December 28, 2006
    Publication date: June 10, 2010
    Applicant: Nambition GmbH
    Inventors: Leif Riemenschneider, Gerd Hoffman
  • Publication number: 20100031403
    Abstract: The invention concerns a heat coupling device for scanning force or atomic force microscopy, comprising a first heat conducting device (27), a second heat conducting device (28) and a coupling device (36, 38, 39, 40, 41), in which the first heat conducting device (27) is movable relative to the second heat conducting device (28) and the coupling device (36, 38, 39, 40, 41) is arranged between the first and second heat conducting device (27, 28) and designed so that it is at least partially deformable fluid-like and/or flexible and the heat can be transferred between the first and second heat conducting device (28).
    Type: Application
    Filed: August 11, 2006
    Publication date: February 4, 2010
    Applicant: Nambition GmbH
    Inventors: Mirko Leuschner, Jens Struckmeier, Ulrich Geisler, Torsten Jahnke
  • Publication number: 20090253589
    Abstract: In one aspect the invention relates to a method for testing a chemical entity for its capability to modulate a (poly)peptide that is malfunctioning by means of an interaction of said chemical entity and said (poly)peptide, the method using single-molecule force spectroscopy. In another aspect the invention relates to a method for testing a chemical or physical entity for its capability to interact with a G protein-coupled receptor (GPCR) in its natural membrane environment, the method using single-molecule force spectroscopy.
    Type: Application
    Filed: September 5, 2006
    Publication date: October 8, 2009
    Applicant: Nambition GmbH
    Inventors: Daniel Müller, Tanuj Sanpra, Krzysztof Palczewski, Paul Shin-Hyun Park