Abstract: A mechanical testing system having a frame, and a stage for holding a sample. An arm for pressing a tool against a surface of the sample. A primary actuator is connected to the frame and applies a primary force and drives the tool relative to the sample, thereby causing the frame to flex. A displacement sensor measures a displacement value comprised of two components, the first component including a distance traveled by the probe into the sample as the primary force is applied, and the second component including a measure of a degree of flex of the frame as the primary force is applied. A compensating actuator is connected to the frame and applies a compensating force that reduces the second component of the displacement value.
Type:
Application
Filed:
April 4, 2016
Publication date:
October 5, 2017
Applicant:
Nanomechanics, Inc.
Inventors:
Warren C Oliver, Sudharshan P Pardhasaradhi, Michael P Drake
Abstract: The application describes an electromechanical actuator for generating a mechanical force to be transferred to an apparatus. The electromechanical actuator comprises an electromagnetic coil, a connecting member, and a magnet. The connecting member is mechanically coupled between the electromagnetic coil and the apparatus and is configured to transfer the mechanical force from the electromagnetic coil to the apparatus. The magnet is disposed between the electromagnetic coil and the apparatus and includes a channel in which the electromagnetic coil is disposed, the channel having a channel opening that faces away from the apparatus, the magnet further having a central hole through which the connecting member extends.
Type:
Grant
Filed:
March 15, 2013
Date of Patent:
July 18, 2017
Assignee:
Nanomechanics, Inc.
Inventors:
Warren Oliver, John Swindeman, Michael Drake
Abstract: A heated or cooled sample holding stage for use in a nanoindentation measurement system is described. The geometry of the design and the selection of materials minimizes movement of a sample holder with respect to a nanoindentation tip over a wide range of temperatures. The system controls and minimizes motion of the sample holder due to the heating or cooling of the tip holder and/or the sample holder in a high temperature nanoindentation system. This is achieved by a combination of geometry, material selection and multiple sources and sinks of heat. The system is designed to control both the steady state and the transient displacement response.
Type:
Application
Filed:
March 22, 2016
Publication date:
September 29, 2016
Applicant:
Nanomechanics, Inc.
Inventors:
Warren Oliver, Sudharshan Phani Pardhasaradhi, Richard Anthony
Abstract: An electrostatic force testing apparatus applies an electrostatic force to a test specimen and thereby imparts stress on the specimen. A focused electrostatic force is applied to the test specimen using a shaped probe tip of the electrostatic force testing apparatus. The force applied to the test specimen may be varied based on a distance of the probe tip from the test specimen, a voltage applied to the probe tip, and a shape of the probe tip.
Abstract: The application describes an electromechanical actuator for generating a mechanical force to be transferred to an apparatus. The electromechanical actuator comprises an electromagnetic coil, a connecting member, and a magnet. The connecting member is mechanically coupled between the electromagnetic coil and the apparatus and is configured to transfer the mechanical force from the electromagnetic coil to the apparatus. The magnet is disposed between the electromagnetic coil and the apparatus and includes a channel in which the electromagnetic coil is disposed, the channel having a channel opening that faces away from the apparatus, the magnet further having a central hole through which the connecting member extends.
Type:
Application
Filed:
March 15, 2013
Publication date:
January 29, 2015
Applicant:
Nanomechanics, Inc.
Inventors:
Warren Oliver, John Swindeman, Michael Drake