Patents Assigned to NanoMegas SPRL
  • DEVICES AND METHODS FOR HIGH ANGLE LIQUID ELECTRON TOMOGRAPY
    Publication number: 20230010573
    Abstract: Devices and methods are described for performing high angle tilting tomography on samples in a liquid medium using transmission electron beam instruments.
    Type: Application
    Filed: December 18, 2020
    Publication date: January 12, 2023
    Applicants: Universidad Rey Juan Carlos, NANOMEGAS SPRL
    Inventors: Jesus Gonzales Casablanca, Stavros Nicolopoulos
  • Method and system for improving characteristic peak signals in analytical electron microscopy
    Patent number: 9406496
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: August 2, 2016
    Assignees: UNIVERSITAT DE BARCELONA, NANOMEGAS SPRL, APPFIVE LLC
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiró Martinez, José Manuel Rebled Corsellas, Lluís Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss
  • METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANALYTICAL ELECTRON MICROSCOPY
    Publication number: 20130240728
    Abstract: A method and system are disclosed for improving characteristic peak signals in electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDS) measurements of crystalline materials. A beam scanning protocol is applied which varies the inclination, azimuthal angle, or a combination thereof of the incident beam while spectroscopic data is acquired. The method and system may be applied to compositional mapping.
    Type: Application
    Filed: November 19, 2012
    Publication date: September 19, 2013
    Applicants: Universitat de Barcelona, AppFive LLC, Nanomegas SPRL
    Inventors: Sonia Estrade Albiol, Joaquin Portillo Serra, Francisca Peiro Martinez, José Manuel Rebled Corsellas, Lluis Yedra Cardona, Stavros Nicolopoulos, Steven Kim, Jon Karl Weiss
  • Methods and devices for high throughput crystal structure analysis by electron diffraction
    Patent number: 8253099
    Abstract: A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
    Type: Grant
    Filed: November 6, 2009
    Date of Patent: August 28, 2012
    Assignee: NanoMegas SPRL
    Inventors: Stavros Nicolopoulos, Daniel Bultreys, Edgard Rauch
  • METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION
    Publication number: 20110220796
    Abstract: A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
    Type: Application
    Filed: November 6, 2009
    Publication date: September 15, 2011
    Applicant: NanoMegas SPRL
    Inventors: Stavros Nicolopoulos, Daniel Bultreys, Edgard Rauch