Patents Assigned to Nanonex Corporation
  • Publication number: 20190294040
    Abstract: A nanoimprint system and methods for separating imprinted substrates with nano-scale patterns from mold for manufacturing. Generally, the system includes means to create, monitor, and control relative movement between the mold and substrate for separation. It is capable of controlling where and when the separation happens and finishes. The relative movement may be generated by motion stages, springs, stage driven flexures, inflatable O-rings, gas flow, and other mechanical means. It may be monitored by separation force, overhead camera, and vacuum/pressures in different area of the system. The relative movement may be any combination of stages movements and movement sequences. The separation speed, direction, and force can be well controlled in the system to achieve fast and reliable separation between mold and substrate, and at the same time maintain the pattern shape and details on the consolidated imprint resist.
    Type: Application
    Filed: September 21, 2018
    Publication date: September 26, 2019
    Applicant: Nanonex Corporation
    Inventors: Hua TAN, Lin HU, Stephen Y. CHOU
  • Publication number: 20190263032
    Abstract: A nanoimprint lithography system and method for manufacturing substrates with nano-scale patterns, having a process chamber with transparent sections on both top and side walls, a robot for automatic molds and substrates loading and unloading, and optical and stage apparatuses to obtain the desired spatial relationship between the mold and substrate, with an enclosed volume referring to mold mini-chamber being formed between the mold/holder and top wall of the chamber and with the process chamber and mini-chamber being capable of both vacuuming and pressurizing, and inside the chamber, a ring shape seal assembly is installed and a mold support assembly can be installed that aids in imprinting all the way to the edge of the substrate with various embodiments for carrying out fluid pressure imprinting, separation, measurement and control of mold and substrate gap, substrate thickness, and system axial force.
    Type: Application
    Filed: September 21, 2018
    Publication date: August 29, 2019
    Applicant: Nanonex Corporation
    Inventors: Hua TAN, Lin HU, Wei ZHANG, Stephen Y. CHOU
  • Patent number: 10105883
    Abstract: A nanoimprint lithography system and method for manufacturing substrates with nano-scale patterns, having a process chamber with transparent sections on both top and side walls, a robot for automatic molds and substrates loading and unloading, and optical and stage apparatuses to obtain the desired spatial relationship between the mold and substrate, with an enclosed volume referring to mold mini-chamber being formed between the mold/holder and top wall of the chamber and with the process chamber and mini-chamber being capable of both vacuuming and pressurizing, and inside the chamber, a ring shape seal assembly is installed and a mold support assembly can be installed that aids in imprinting all the way to the edge of the substrate with various embodiments for carrying out fluid pressure imprinting, separation, measurement and control of mold and substrate gap, substrate thickness, and system axial force.
    Type: Grant
    Filed: March 16, 2014
    Date of Patent: October 23, 2018
    Assignee: NANONEX CORPORATION
    Inventors: Hua Tan, Lin Hu, Wei Zhang, Stephen Y. Chou
  • Patent number: 10108086
    Abstract: A nanoimprint system and methods for separating imprinted substrates with nano-scale patterns from mold for manufacturing. Generally, the system includes means to create, monitor, and control relative movement between the mold and substrate for separation. It is capable of controlling where and when the separation happens and finishes. The relative movement may be generated by motion stages, springs, stage driven flexures, inflatable O-rings, gas flow, and other mechanical means. It may be monitored by separation force, overhead camera, and vacuum/pressures in different area of the system. The relative movement may be any combination of stages movements and movement sequences. The separation speed, direction, and force can be well controlled in the system to achieve fast and reliable separation between mold and substrate, and at the same time maintain the pattern shape and details on the consolidated imprint resist.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: October 23, 2018
    Assignee: NANONEX CORPORATION
    Inventors: Hua Tan, Lin Hu, Stephen Y. Chou
  • Publication number: 20180231520
    Abstract: The present invention provides methods and apparatus that can manipulate, detect, and/or analyze single molecules, single small particles or single small samples of matter passing through a nanoscale gap within a nanofluidic channel of a detector.
    Type: Application
    Filed: October 9, 2017
    Publication date: August 16, 2018
    Applicant: Nanonex Corporation
    Inventors: Stephen Y. Chou, Xiaogan Liang
  • Patent number: 9810680
    Abstract: The present invention provides methods and apparatus for measuring a property of an sample, the apparatus can manipulate, detect, and analyze the sample composed of single molecules, single small particles or single small samples of matter by drawing the sample into a nanofluidic channel and stretching the sample within the channel, passing the stretched sample through a gap having a width of less than or equal to 20 nm of a nanogap detector positioned inside or adjacent to the nanofluidic channel and measuring an output from the nanogap detector representative of the property of the sample.
    Type: Grant
    Filed: April 16, 2010
    Date of Patent: November 7, 2017
    Assignee: Nanonex Corporation
    Inventors: Stephen Y. Chou, Xiaogan Liang
  • Patent number: 9533445
    Abstract: Methods for nanoimprint lithography using a deformable mold. Generally, the method includes a deformable mold fixed firmly onto a hollow mold holder around its full periphery is attached to top inner surface of the chamber and positioned underneath the transparent section. The central area of the mold is freely accessible from underneath through the opening of the mold holder. At beginning of the imprinting, the substrate with a layer of resist is positioned underneath the mold at a predetermined gap between them and a substrate is moved up to contact with the mold either under vacuum or under atmosphere. After consolidating the resist, the substrate is separated from the mold by either direct pull-down enabled by stage movement or deforming the mold enabled by differential pressure between the mold mini-chamber and the bulk volume of the chamber, or mixing of both.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: January 3, 2017
    Assignee: NANONEX CORPORATION
    Inventors: Wei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
  • Publication number: 20140239529
    Abstract: A system and method for patterning a substrate includes a mold holding fixture for holding a mold with nanostructures and a substrate holding fixture for holding a substrate having a molding surface, a stage assembly has two or more independent axis movements for moving either the mold or the substrate therein, a contact force sensor sensing a contact force between the mold surface and the molding surface, a chamber for holding the mold and substrate and for the applying of a pressure inside that is higher or lower than atmospheric pressure, a pressure regulator and a manifold for changing the pressure inside the chamber, a door on the chamber housing provides for selectively allowing the substrate and the mold to pass there through, and means to divide the chamber into two fluidly separate sub-chambers.
    Type: Application
    Filed: September 30, 2013
    Publication date: August 28, 2014
    Applicant: Nanonex Corporation
    Inventors: Hua Tan, Lin Hu, Yi Yao, Stephen Y. Chou
  • Patent number: 8747092
    Abstract: The invention disclosed apparatuses and methods to do nanoimprint lithography using a deformable mold. Generally, the apparatus has a chamber with a transparent section on its top wall, which is capable of vacuuming and pressurizing. The deformable mold fixed firmly onto a hollow mold holder around its full periphery is attached to top inner surface of the chamber and positioned underneath the transparent section. The central area of the mold is freely accessible from underneath through the opening of the mold holder. An enclosed volume referring to mold mini-chamber is formed between the mold/holder and top wall of the chamber. Inside chamber, a stage assembly is installed. A chuck to vacuumly hold a substrate is mounted on top of the stage assembly. At beginning of the imprinting, the substrate with a layer of resist is positioned underneath the mold at a predetermined gap between them. Then, the substrate is moved up to contact with the mold either under vacuum or under atmosphere.
    Type: Grant
    Filed: January 21, 2011
    Date of Patent: June 10, 2014
    Assignee: Nanonex Corporation
    Inventors: Wei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
  • Patent number: 8632720
    Abstract: A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: January 21, 2014
    Assignee: Nanonex Corporation
    Inventors: Wei Zhang, Hua Tan, Stephen Y. Chou
  • Patent number: 8337959
    Abstract: In imprint lithography, the mold is coated with a surface release layer for a non-sticking separation. Bonding strength of the release layer to the mold depends on the cleanness of the surface and the process of release layer deposition. In accordance with the invention, the mold is disposed in an evacuable chamber, cleaned to remove surface organic contamination and coated with the surface release layer in a chamber, all without relocation or undesired time delay. The chamber encloses a support chuck for the mold or substrate, a surface cleaner unit adjacent the support, a heating source adjacent the support, and advantageously, sensors of measuring chamber pressure, vapor partial pressure and moisture concentration. A vapor source connected to the chamber supplies release surfactant vapor. The mold is cleaned, and the cleaning is followed by vapor phase deposition of the surfactant. The mold is advantageously heated. Typical ways of cleaning include exposure to ozone or plasma ion etch.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: December 25, 2012
    Assignee: Nanonex Corporation
    Inventors: Wei Zhang, Lin Hu, Hua Tan, He Gao, Linshu Kong, Stephen Y. Chou
  • Patent number: 8333583
    Abstract: A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: December 18, 2012
    Assignee: Nanonex Corporation
    Inventors: Wei Zhang, Hua Tan, Stephen Y. Chou
  • Patent number: 8025829
    Abstract: In accordance with the invention, step-and-repeat imprint lithography is effected by applying balanced pressing forces from both sides of a substrate. The pressing forces are substantially equal in amplitude and opposite in direction. With the pressing forces thus balanced, the fixture that steps and holds the substrate does not bear the load of imprinting. The balance allows use of a high resolution aligning stage to carry the substrate and to maintain high accuracy of positioning without being shifted by change of load. With this method, sufficient imprint pressure can be used to obtain high quality patterning, a thin and uniform residual layer, and a high fidelity pattern.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: September 27, 2011
    Assignee: Nanonex Corporation
    Inventors: Wei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
  • Publication number: 20110180965
    Abstract: The invention disclosed apparatuses and methods to do nanoimprint lithography using a deformable mold. Generally, the apparatus has a chamber with a transparent section on its top wall, which is capable of vacuuming and pressurizing. The deformable mold fixed firmly onto a hollow mold holder around its full periphery is attached to top inner surface of the chamber and positioned underneath the transparent section. The central area of the mold is freely accessible from underneath through the opening of the mold holder. An enclosed volume referring to mold mini-chamber is formed between the mold/holder and top wall of the chamber. Inside chamber, a stage assembly is installed. A chuck to vacuumly hold a substrate is mounted on top of the stage assembly. At beginning of the imprinting, the substrate with a layer of resist is positioned underneath the mold at a predetermined gap between them. Then, the substrate is moved up to contact with the mold either under vacuum or under atmosphere.
    Type: Application
    Filed: January 21, 2011
    Publication date: July 28, 2011
    Applicant: NANONEX CORPORATION
    Inventors: Wei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
  • Publication number: 20100247698
    Abstract: A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
    Type: Application
    Filed: June 7, 2010
    Publication date: September 30, 2010
    Applicant: NANONEX CORPORATION
    Inventors: Wei Zhang, Hua Tan, Stephen Y. Chou
  • Publication number: 20100244324
    Abstract: A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
    Type: Application
    Filed: June 7, 2010
    Publication date: September 30, 2010
    Applicant: NANONEX CORPORATION
    Inventors: Wei Zhang, Hua Tan, Stephen Y. Chou
  • Patent number: 7322287
    Abstract: Improved apparatus for imprint lithography involves using direct fluid pressure to press a mold into a substrate-supported film. Advantageously the mold and/or substrate are sufficiently flexible to provide wide area contact under the fluid pressure. Fluid pressing can be accomplished by sealing the mold against the film and disposing the resulting assembly in a pressurized chamber. The result of this fluid pressing is enhanced resolution and high uniformity over an enlarged area.
    Type: Grant
    Filed: August 25, 2004
    Date of Patent: January 29, 2008
    Assignee: Nanonex Corporation
    Inventors: Hua Tan, Linshu Kong, Mingtao Li, Stephen Y. Chou
  • Patent number: 6946360
    Abstract: An improved method of bonding involves using direct fluid pressure to press together the layers to be bonded. Advantageously one or more of the layers are sufficiently flexible to provide wide area contact under the fluid pressure. Fluid pressing can be accomplished by sealing an assembly of layers to be bonded and disposing the assembly in a pressurized chamber. It can also be accomplished by subjecting the assembly to jets of pressurized fluid. The result of this fluid pressing is reduction of voids and enhanced uniformity over an enlarged area.
    Type: Grant
    Filed: June 4, 2002
    Date of Patent: September 20, 2005
    Assignee: Nanonex Corporation
    Inventor: Stephen Y. Chou