Abstract: Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.

Abstract: The invention relates to a microcantilever, a measuring device and a method for determining mass and/or mechanical properties of a biological system.

Abstract: An atomic force microscope includes a scanner for scanning a probe along at least one translational axis, a stationary light source for generating an incident light beam, a stationary position sensitive detector for detecting a light beam reflected from a cantilever, an optical guiding mechanism for compensating a scanning motion of the probe and configured to guide the incident light beam to a spot on the cantilever and to guide the reflected light beam from the cantilever to the position sensitive detector, wherein the optical guiding mechanism includes at least two optical deflection elements per translational axis arranged to move synchronously with the probe along the respective translational axis, and configured to define an optical path between the light source and the detector for the incident and reflected light beam such that the optical path length is independent of the translation of the probe along the respective translational axis.

Abstract: The optical detection system typically used in micromechanical cantilever-based instruments, e.g. scanning probe microscopes, chemical or biological sensing probes like “artificial noses”, or molecular force probe instruments, can hardly cope when measuring samples immersed in a fluid, i.e. a gas, gel, or liquid having another refractive index than the environment. Optical readout or detection becomes problematic as soon as the refractive index of the fluid changes, because signals can shift significantly. The invention provides an improved optical means at the interface between the fluid and the environment, avoiding signal shifts, and thus avoiding time-consuming and difficult re-calibration or re-adjustment of the microscope or other cantilever-based instrument.

Abstract: The optical detection system typically used in micromechanical cantilever-based instruments, e.g. scanning probe microscopes, chemical or biological sensing probes like “artificial noses”, or molecular force probe instruments, can hardly cope when measuring samples immersed in a fluid, i.e. a gas, gel, or liquid having another refractive index than the environment. Optical readout or detection becomes problematic as soon as the refractive index of the fluid changes, because signals can shift significantly. The invention provides an improved optical means at the interface between the fluid and the environment, avoiding signal shifts, and thus avoiding time-consuming and difficult re-calibration or re-adjustment of the microscope or other cantilever-based instrument.

Abstract: The invention relates to so-called scanning tips of probes necessary for scanning a measured object, in particular in scanning force microscopes and other scanning microscopes, so-called scanning probe microscopes. The possible resolution of such microscopes depends primarily on the fineness of the tip, i.e. its curvature or radius being as small as possible. According to the invention, a photostructurable material, e.g. a photosensitive resists, serves as the material for the scanning tip which is exposed via a mask and is subsequently developed/hardened in a manner known per se. The unexposed parts of the photosensitive resist are removed as usual. By the shape of the exposure mask, the preferably directed exposure of the photosensitive resist, and the subsequent hardening, a tip is formed preferably laterally on or at a carrier, usually made from a different material, which is provided with a very small radius, thus very well suitable for scanning probe microscopy and similar applications.

Abstract: Finely adjustable actuators are used for positioning a sensor or a scanning tip, especially for scanning tunnelling microscopes and other scanning microscopes, i.e. scanning probe microscopes. The invention relates to the construction of such an actuator which can carry out three-dimensional movements of a scanning tip with high regulating accuracy while being of robust and compact design. This is achieved by a sensible arrangement of a plural number of electromagnetic actuator elements acting on a common rigid sensor carrier. The invention provides a robust and relatively simple solution for positioning the scanning tip; an important and problematic task in scanning probe microscopy and in related fields. It permits positioning at high resolution as well as with a relatively long regulating range. Further advantages include good repetition accuracy and little mass which reduces both energy consumption and interference.

Abstract: The invention relates to the field of frequency measuring, in particular to extremely accurate difference frequency measuring as it is used in the area of measuring instruments, e.g. in scanning atomic force microscopes or other scanning probe microscopes, or in the area of thermogravimetry for determining extremely small masses in the ng-range. The invention relates in particular to the principle of such a hybrid frequency measuring device or frequency detector, i.e. a frequency measuring device or frequency detector comprising both digital and analog components or groups of components. The invention also relates to an advantageous use of such a frequency detector for evaluation of the frequency measurements of a scanning probe microscope. A frequency measuring arrangement can be at least partly integrated in a measuring head of a scanning probe microscope, thus enabling a robust, and at the same time sensitive, measuring arrangement.