Patents Assigned to Nanovea, Inc.
  • Patent number: 10274312
    Abstract: A system and device that measures a specimen's surface profile by passing a bright white light source through a series of lenses which generate repeatable chromatic focal shift variations of wavelengths of white light for Z axis measurements. The movement of the sensor along an X-Y raster pattern is controlled by a X-directional and Y-directional scanner used in combination with X and Y actuators. The system and device translate the chromatic focal shifts into digital data which may then be used to both control the position of the lenses along the surface of the specimen and generate a 3D topographical images of the specimens being profiled.
    Type: Grant
    Filed: August 22, 2018
    Date of Patent: April 30, 2019
    Assignee: Nanovea, Inc.
    Inventors: Pierre Leroux, Fernando Valenzuela, Curt Deckert
  • Publication number: 20140298897
    Abstract: The present invention is a nano wear testing apparatus, which preferably includes a linear motor, nano module assembly, piezoelectric member, load cell, tip mounting shaft, stage, and speaker coil. The linear motor preferably repositions the nano module assembly in close contact to the surface of a test sample, which is generally attached to the stage. The piezoelectric member moves the load cell and tip mounting shaft near the surface of the sample, and the load cell detects a contact load defined in the software application. The piezoelectric member continues to increase the load until the predetermined load for the test is reached. Once reached, the speaker coils shifts the stage at a frequency and stroke length set in the software application. During the test, the load cell and piezoelectric table continuously adjusts to keep a constant load during the test. Once the test is finished, the speaker coil stops and the load is then removed. Generally, load and depth data is recorded during the test.
    Type: Application
    Filed: April 9, 2013
    Publication date: October 9, 2014
    Applicant: Nanovea, Inc.
    Inventors: Pierre Leroux, Fernando Valenzuela, Timothy Palermo, Jeffrey Tomita
  • Patent number: 8281648
    Abstract: A non-contact sensor is attached to the indenting module with its working range encompassing the tip of the indenter. The sensor directly measures penetration depth of the indenter during scratch, wear or instrumented hardness testing. During the test, the non-contact sensor records the height of the surface as the indenter penetrates the surface of the testing specimen.
    Type: Grant
    Filed: December 17, 2008
    Date of Patent: October 9, 2012
    Assignee: Nanovea, Inc.
    Inventor: Pierre Leroux