Patents Assigned to National Applied Research Laboratories National Chip International Center
  • Patent number: 7435663
    Abstract: Simple but practical methods to dice a CMOS-MEMS multi-project wafer are proposed. On this wafer, micromachined microstructures have been fabricated and released. In a method, a photoresist is spun on the full wafer surface, and this photoresist is thick enough to cover all cavities and structures on the wafer, such that the photoresist will protect the released structures free from the chipping, vibrations, and damages in the diamond blade dicing process. In another method, a laser dicing system is utilized to scribe the multi-project wafer placed on a platform, and by precisely controlling the platform moving-track, the dicing path can be programmed to any required shape and region, even it is not straight. In addition, the wafer backside is mounted on a blue-tape at the beginning to enhance the process reliability.
    Type: Grant
    Filed: November 10, 2005
    Date of Patent: October 14, 2008
    Assignee: National Applied Research Laboratories National Chip International Center
    Inventors: Sheng-Hsiang Tseng, Fu-Yuan Xiao, Ying-Zong Juang, Chin-Fong Chiu