Patents Assigned to National Institute of Metrology
  • Patent number: 10504712
    Abstract: A mass spectrometry device comprises a reaction gas introduction device and a gas phase molecule-ion reaction mass spectrometry analysis device, wherein the reaction gas introduction device is connected to the gas phase molecule-ion reaction mass spectrometry analysis device; the reaction gas introduction device is configured to introduce reaction gas into the gas phase molecule-ion reaction mass spectrometry analysis device; and the gas phase molecule-ion reaction mass spectrometry analysis device is configured to enable molecules or ions to be subjected to a reaction and carry out mass spectrometry analysis on a reaction result. The reaction gas introduction device comprises a reaction gas container, the reaction gas container being configured to contain gas or volatile liquid or solid and generate gas molecules needed by a reaction; and a reaction gas quantitation device, configured to carry out flow control on the gas molecules.
    Type: Grant
    Filed: March 23, 2016
    Date of Patent: December 10, 2019
    Assignee: National Institute of Metrology, China
    Inventors: You Jiang, Xiang Fang, Xing-Chuang Xiong, Ze-Jian Huang
  • Patent number: 10378950
    Abstract: The invention relates to a measuring device for measuring the mass of a weight, comprising a main frame, a main beam supported on the main frame and comprising a central knife and two side knives parallel with the central knife; a balancing system loaded on one end of the main beam and comprising a set of counterweights; a weighting system loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system. The central knife and the two side knives are made from metal with a high temperature-cryogenic cycling process. The central knife and the two side knives are configured to be adjusted in parallelism with a three-coordinates measuring machine. The control system is adapted to control the balancing system and the weighting system to synchronously load or unload the balancing system and the weighting system.
    Type: Grant
    Filed: October 12, 2016
    Date of Patent: August 13, 2019
    Assignee: NATIONAL INSTITUTE OF METROLOGY
    Inventors: Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu, Xiaolei Wang, Honglei Ji, Xiang Wang, Ping Chen
  • Patent number: 10274362
    Abstract: The invention discloses a measuring device for measuring the mass of a weight, comprising: a main frame; a main beam supported on main frame; a balancing system loaded on one end of the main beam; a weighting system, loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system comprising an optical sensor mounted in the main frame, a laser displacement sensor mounted on the main beam, a monitor, and a control unit connected electrically to the optical sensor, the laser displacement sensor and the monitor. The control system is adapted to compare a main beam first displacement data obtained by the optical sensor and a main beam second displacement data obtained by the laser displacement sensor to accurately measure the actual displacement of the main beam.
    Type: Grant
    Filed: October 12, 2016
    Date of Patent: April 30, 2019
    Assignee: NATIONAL INSTITUTE OF METROLOGY
    Inventors: Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu, Xiaolei Wang, Honglei Ji, Xiang Wang, Ping Chen
  • Publication number: 20190086255
    Abstract: The invention relates to a measuring device for measuring the mass of a weight, comprising a main frame, a main beam supported on the main frame and comprising a central knife and two side knives parallel with the central knife; a balancing system loaded on one end of the main beam and comprising a set of counterweights; a weighting system loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system. The central knife and the two side knives are made from metal with a high temperature-cryogenic cycling process. The central knife and the two side knives are configured to be adjusted in parallelism with a three-coordinates measuring machine. The control system is adapted to control the balancing system and the weighting system to synchronously load or unload the balancing system and the weighting system.
    Type: Application
    Filed: October 12, 2016
    Publication date: March 21, 2019
    Applicant: National Institute of Metrology
    Inventors: Jian WANG, Changqing CAI, Xiaoping REN, Tao LI, Manhong HU, Xiaolei WANG, Honglei JI, Xiang WANG, Ping CHEN
  • Patent number: 10169870
    Abstract: The present invention relates to a novel objective method for assessing high contrast resolution of images based on Rayleigh criterion and a testing operating method. The novel objective method for assessing high contrast resolution of images based on Rayleigh criterion involves combining the Rayleigh criterion with regional pixel intensity profiles for simultaneous application to high contrast resolution images of CT equipment, which allows objective assessment by using the Rayleigh criterion after the drawing of the regional pixel intensity profiles; the introduction of a normalized margin and the use of a Lanczos window function for interpolation processing on original images enable a considerably practical, time-effective and operable objective assessment method that is convenient for testers to use and also easy for CT equipment operators to use.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: January 1, 2019
    Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINA
    Inventors: Pu Zhang, Wenli Liu
  • Patent number: 10163618
    Abstract: The invention proposes a mass spectrometry apparatus for ultraviolet light ionization of neutral lost molecules, and a method for operating same. The mass spectrometry apparatus for ultraviolet light ionization of neutral lost molecules includes a quadrupole tandem special linear ion trap mass analyzer, a vacuum ultraviolet lamp, a lamp front shutter, a gradient vacuum system and other necessary components for the mass spectrometry apparatus. In addition, the invention also proposes a method for operating the apparatus to efficiently store ions, fragment and analyze the ions, perform ultraviolet efficient ionization on lost neutral molecules, and then analyze the ions.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: December 25, 2018
    Assignee: NATIONAL INSTITUTE OF METROLOGY CHINA
    Inventors: Xingchuang Xiong, Xiang Fang, You Jiang, Xiaoyun Gong, Zejian Huang, Meiying Liu
  • Publication number: 20180335337
    Abstract: The invention discloses a measuring device for measuring the mass of a weight, comprising: a main frame; a main beam supported on main frame; a balancing system loaded on one end of the main beam; a weighting system, loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system comprising an optical sensor mounted in the main frame, a laser displacement sensor mounted on the main beam, a monitor, and a control unit connected electrically to the optical sensor, the laser displacement sensor and the monitor. The control system is adapted to compare a main beam first displacement data obtained by the optical sensor and a main beam second displacement data obtained by the laser displacement sensor to accurately measure the actual displacement of the main beam.
    Type: Application
    Filed: October 12, 2016
    Publication date: November 22, 2018
    Applicant: National Institute of Metrology
    Inventors: Jian WANG, Changqing CAI, Xiaoping REN, Tao LI, Manhong HU, Xiaolei WANG, Honglei JI, Xiang WANG, Ping CHEN
  • Patent number: 9964681
    Abstract: A high-diffusion-coefficient and high-brightness light source generation device comprising: a light source module, an optical fiber bundle and an optical fiber hemisphere emitter, wherein the light source module provides the optical fiber bundle with a plane light source having the same size as an end surface of an incident end thereof, the incident end receives light emitted from the light source module, exit ends transmit the light to the optical fiber hemisphere emitter, the exit ends of the optical fiber bundle arranged on a hemispherical wall of the optical fiber hemisphere emitter in an equal solid angle manner, an end surface of each optical fiber exit end located on the same surface as the inner wall of a hemisphere, a bottom plate arranged above an opening of the optical fiber hemisphere emitter, and an opal glass window arranged at the circle center position of the bottom plate.
    Type: Grant
    Filed: February 10, 2015
    Date of Patent: May 8, 2018
    Assignee: THE NATIONAL INSTITUTE OF METROLOGY(CHINA)
    Inventors: Zilong Liu, Yu Wang, Wenli Liu, Rui Chen
  • Publication number: 20170271137
    Abstract: The invention discloses a networking mass analysis method and device, and belongs to the field of mass spectrometer and ion mass analysis. The device comprises an ion source, an ion transporter, an ion deflector and multiple mass analyzers, wherein the ion transporter is connected with one of the multiple mass analyzers, the multiple mass analyzers are connected with the ion deflector respectively, the ion source produces the ions to be detected, the ions to be detected enter any of the mass analyzers connected with the ion deflector via the ion transporter for mass analysis, and the remaining ions to be detected are transported to the corresponding mass analyzers via the ion deflector for mass analysis. The invention can improve the mass analysis duty ratio of continuous ion sources and obtain more mass-to-charge ratio information of ion beams within each time slot.
    Type: Application
    Filed: March 23, 2016
    Publication date: September 21, 2017
    Applicant: National Institute of Metrology, China
    Inventors: You JIANG, Xiang FANG, Xingchuang XIONG, Zejian HUANG
  • Patent number: 9679759
    Abstract: The present invention discloses a rectangular ion trap device and method for ion storage. The device comprises a front end cover including left electrode, middle layer insulator, and right electrode, wherein the left electrode and the right electrode are respectively positioned at both sides of the middle layer insulator; a rear end cover, wherein the rear end cover has the same axis as the front end cover, and the central position of the rear end cover electrode is penetrated; the front and rear electrodes and the upper and lower electrodes are symmetric along the axis of the front end cover, and these electrodes form a space region for ion storage about the axis between the front end cover and the rear end cover electrode. The present invention can increase the number of ions in storage within a unit time prominently.
    Type: Grant
    Filed: August 15, 2014
    Date of Patent: June 13, 2017
    Assignee: National Institute of Metrology, China
    Inventors: Xingchuang Xiong, You Jiang, Zejian Huang, Xiang Fang
  • Patent number: 9539616
    Abstract: The infrasound generating device based on a displacement-feedback type vibration exciter comprises a displacement-feedback type vibration exciter system, an infrasound generating chamber (3) and a laser vibrometer (1); the displacement feedback mechanism is adopted in the vibration exciter (2). The piston (31) is driven by the vibration exciter to move in a sinusoidal manner in the cavity (35) of the airtight infrasound generating chamber (3) and the standard infrasonic pressure signal with low harmonic distortion can be achieved. The displacement of the moving part (22) of the vibration exciter (2) can be measured by the laser vibrometer (1) through the measurement beam (15) injecting into the vibration exciter (2) through the optical channel running through the vibration exciter and the standard infrasonic pressure can also be obtained. The value of the standard sound pressure produced by the infrasound generating chamber is calculated.
    Type: Grant
    Filed: August 16, 2012
    Date of Patent: January 10, 2017
    Assignees: ZHEJIANG UNIVERSITY, NATIONAL INSTITUTE OF METROLOGY P. R. CHINA
    Inventors: Wen He, Longbiao He, Chunyu Wang, Yuanlai Zhou, Shushi Jia
  • Publication number: 20160293396
    Abstract: The present invention discloses a rectangular ion trap device and method for ion storage. The device comprises a front end cover including left electrode, middle layer insulator, and right electrode, wherein the left electrode and the right electrode are respectively positioned at both sides of the middle layer insulator; a rear end cover, wherein the rear end cover has the same axis as the front end cover, and the central position of the rear end cover electrode is penetrated; the front and rear electrodes and the upper and lower electrodes are symmetric along the axis of the front end cover, and these electrodes form a space region for ion storage about the axis between the front end cover and the rear end cover electrode. The present invention can increase the number of ions in storage within a unit time prominently.
    Type: Application
    Filed: August 15, 2014
    Publication date: October 6, 2016
    Applicant: NATIONAL INSTITUTE OF METROLOGY, CHINA
    Inventors: Xingchuang XIONG, You JIANG, Zejian HUANG, Xiang FANG
  • Patent number: 9347823
    Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.
    Type: Grant
    Filed: January 28, 2014
    Date of Patent: May 24, 2016
    Assignee: NATIONAL INSTITUTE OF METROLOGY
    Inventor: Ruoduan Sun
  • Patent number: 9323158
    Abstract: A design method of extreme ultraviolet lithography projection objective comprises: determining the optical design parameters of the lithography projection objective, setting the projection objective to include six lenses and an aperture diaphragm, and dividing the six lenses into the three groups according to the beam propagation direction; determining the radii and the intervals of the first and third groups, respectively; and determining the radii and the intervals of the second group of lenses according to the parameters of the foregoing two groups of lenses. The design method has the advantage of avoiding the blindness in revising and error testing of the existing structure of the conventional optical design method by calculating lens structures that meet the parameter conditions, so that light rays can be selected conveniently according to the special requirements of optical processing detection, and a mass of searches and judgments can be avoided.
    Type: Grant
    Filed: February 28, 2012
    Date of Patent: April 26, 2016
    Assignee: National Institute of Metrology
    Inventors: Yanqiu Li, Fei Liu
  • Patent number: 9099943
    Abstract: The electromagnetic vibration exciter system with an adjustable electro-viscoelastic suspension device comprises an electromagnetic vibration exciter, a power amplifier and an adjustable electro-viscoelastic suspension device, which acts as the suspension device of the electromagnetic vibration exciter. The adjustable electro-viscoelastic suspension device contains a displacement sensor detecting the displacement of the moving component, a first adjustable amplifier and a second adjustable amplifier, a differentiator, an adjustable phase shifter, an adder and a proportioner. The linearity of the stiffness and damping of the exciter system is excellent, which can be adjusted as need through the adjustment of gain of the adjustable amplifier, the proportioner, the adjustable phase shifter. This invention has adjustable and linear parameters and it is also easy to be realized.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: August 4, 2015
    Assignees: ZHEIJIANG UNIVERSITY, NATIONAL INSTITUTE OF METROLOGY P.R. CHINA
    Inventors: Wen He, Chunyu Wang, Runjie Shen, Shushi Jia, Mei Yu, Mingde Ma
  • Patent number: 9097603
    Abstract: The vibration exciter system with a feedback control unit based on an optical linear encoder includes a vibration exciter, a signal generator and a power amplifier. The exciter system further comprises an optical linear encoder converting the displacement of moving component of the exciter into A/B pulse with a phase difference of 90° , a filtering, shaping and level translator unit converting the A/B pulse into standard pulse with standard shape and level, a subdivider and orientation recognizer unit refining standard pulse and recognizing the moving orientation, an analog converter unit converting refined standard pulse into analogue signal that reflects the displacement of the moving component. The standard signal outputted by the signal generator and the converted analogue signal are inputted into a subtracter as the minuend and subtrahend respectively. The output of the subtracter is inputted into the power amplifier and then into the vibration exciter as a driving signal.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: August 4, 2015
    Assignees: ZHEJIANG UNIVERSITY, NATIONAL INSTITUTE OF METROLOGY P. R. CHINA
    Inventors: Wen He, Chunyu Wang, Runjie Shen, Shushi Jia, Mei Yu, Mingde Ma
  • Patent number: 9036668
    Abstract: A method for quasi-synchronous tuning of wavelength or frequency of grating external-cavity semiconductor laser and a corresponding semiconductor laser are provided. A grating or mirror is rotated around a quasi-synchronous tuning point (Pq) as rotation center, so as to achieve the frequency selections by grating and resonance cavity in quasi-synchronous tuning, wherein the angle of the line between the quasi-synchronous tuning point (Pq) and a conventional synchronous tuning point (P0) with respect to the direction of light incident on the grating is determined according to the angle difference between the incidence angle and diffraction angle of light on the grating. According to present invention, approximately synchronous tuning of laser is achieved with a simple and flexible design.
    Type: Grant
    Filed: June 10, 2009
    Date of Patent: May 19, 2015
    Assignee: NATIONAL INSTITUTE OF METROLOGY P.R. CHINA
    Inventors: Erjun Zang, Jianping Cao, Ye Li, Zhanjun Fang
  • Patent number: 8953649
    Abstract: A method for quasi-synchronous tuning of wavelength or frequency of grating external-cavity semiconductor laser and a corresponding semiconductor laser are provided. A grating or mirror is rotated around a quasi-synchronous tuning point (Pq) as rotation center, so as to achieve the frequency selections by grating and resonance cavity in quasi-synchronous tuning, wherein the angle of the line between the quasi-synchronous tuning point (Pq) and a conventional synchronous tuning point (P0) with respect to the direction of light incident on the grating is determined according to the angle difference between the incidence angle and diffraction angle of light on the grating. According to present invention, approximately synchronous tuning of laser is achieved with a simple and flexible design.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: February 10, 2015
    Assignee: National Institute of Metrology P.R. China
    Inventors: Erjun Zang, Jianping Cao, Ye Li, Zhanjun Fang
  • Publication number: 20150009501
    Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.
    Type: Application
    Filed: January 28, 2014
    Publication date: January 8, 2015
    Applicant: NATIONAL INSTITUTE OF METROLOGY, P.R.CHINA
    Inventor: Ruoduan Sun
  • Patent number: 8823359
    Abstract: This disclosure relates to a three-phase electric energy measurement apparatus, comprising: a voltage detection unit for detecting voltage of each phase in power transmitting lines where the voltage detection unit is; a current detection unit for detecting current of each phase in the power transmitting lines where the current detection unit is; an electric energy calculation unit, connected to said voltage detection unit and said current detection unit, for receiving signals outputted from said voltage detection unit and said current detection unit, and performing signal processing and calculation, and then outputting a calculation result; wherein both said voltage detection unit and said electric energy calculation unit are connected in a star connection mode, forming a common virtual ground. Through the above-mentioned grounding manner different from that in the prior art, a three-phase four-wire electric energy meter is formed using a three-phase three-wire connection method.
    Type: Grant
    Filed: December 11, 2009
    Date of Patent: September 2, 2014
    Assignee: National Institute of Metrology P.R. China
    Inventors: Zhigao Zhang, Zhishou Zheng, Qingchang Qu