Patents Assigned to National Instruments Corporation
  • Patent number: 11994545
    Abstract: A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.
    Type: Grant
    Filed: April 25, 2022
    Date of Patent: May 28, 2024
    Assignee: National Instruments Corporation
    Inventors: Chin-Hong Cheah, Tatt-Wee Oong, Eric Hartner
  • Publication number: 20240160542
    Abstract: Techniques for assigning scenario-based tests to test assets are described. In an example, a scenario-based test operable to test a key performance indicator (KPI) of a System Under Test (SUT), a component behavior exhibited by a first component of the SUT, and a scenario characteristic are received. Based on the component behavior and the scenario characteristic, a first plurality of behavior models associated with the component behavior are identified. Based on the scenario characteristic a characteristic value is extracted from the scenario-based test. Each behavior model of the first plurality of behavior models is executed using the characteristic value to generate a first plurality of predicted behavior outcomes. Based on the first plurality of predicted behavior outcomes, a first test asset type from a plurality of test asset types is selected and the scenario-based test is transmitted to a test asset of the first test asset type.
    Type: Application
    Filed: November 10, 2022
    Publication date: May 16, 2024
    Applicant: National Instruments Corporation
    Inventors: Shaul Teplinsky, Kyle Ross Bryson, Stephen Thung, Douglas William Farrell, James C. Nagle, Jeffrey Marcus Monroe
  • Patent number: 11982699
    Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: May 14, 2024
    Assignee: National Instruments Corporation
    Inventors: Martin Obermaier, Martin Laabs, Dirk Plettemeier, Marc Vanden Bossche, Thomas Deckert, Vincent Kotzsch, Johannes Dietmar Herbert Lange
  • Patent number: 11959945
    Abstract: Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component.
    Type: Grant
    Filed: November 26, 2020
    Date of Patent: April 16, 2024
    Assignee: National Instruments Corporation
    Inventors: Jun Lu, John George Banaska, Matthew Tate Dougan, Jeffrey Allan Cornell, Wendi Song, Xuechen Han, Kunal Harsad Patel
  • Patent number: 11901636
    Abstract: Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: February 13, 2024
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Dong Chen
  • Patent number: 11901927
    Abstract: Dynamic range of radio frequency transmitters and receivers may be improved via a multiple-channel phasor configuration in which channels are phased in a manner that distributes the local oscillator phases over ?/2 radians. A multiple-channel phasing receiver may include a power splitter to split an input signal into multiple signals, and may further include multiple single-channel receivers providing intermediate signals. Each single-channel receiver may have an input that receives a respective signal of the multiple signals, and may further have an output to provide a respective intermediate signal as a function of the respective input signal, a total gain applied to the respective input signal, a signal frequency of the local oscillator signal, and a respective phase of the local oscillator signal. The multiple-channel receiver may include a digital signal processor that combines the plurality of intermediate signals into a single output signal.
    Type: Grant
    Filed: April 5, 2022
    Date of Patent: February 13, 2024
    Assignee: National Instruments Corporation
    Inventors: Nikhil Ashok Deshmukh, Michael Loehning
  • Patent number: 11803456
    Abstract: Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: October 31, 2023
    Assignee: National Instruments Corporation
    Inventors: Sundeep Chandhoke, Gururaja Kasanadi Ramachandra, Rajaramm Chokkalingam Malarvizhy, Varun Mehra, Bjoern Bachmann
  • Patent number: 11796621
    Abstract: Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
    Type: Grant
    Filed: November 12, 2021
    Date of Patent: October 24, 2023
    Assignee: National Instruments Corporation
    Inventor: Sartaj Chaudhary
  • Patent number: 11789074
    Abstract: Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
    Type: Grant
    Filed: October 13, 2021
    Date of Patent: October 17, 2023
    Assignee: NATIONAL INSTRUMENTS CORPORATION
    Inventors: James C. Nagle, Stephen Thung, Sergey Kizunov, Shaul Teplinsky
  • Patent number: 11778768
    Abstract: A connector gap between a module connector mating surface and the backplane connector of a chassis may be eliminated through a mechanism that forcefully pushes (or pulls) the module towards the backplane and/or forcefully pushes (or pulls) the backplane toward the module. A spring-loaded or resilient element may be used to fasten the module in a way that effectively fills any designed-in and tolerance-induced gap in the connector interface, allowing the connector to fully seat. In addition, a gasket or other compressible member may be included at the connector mating interface. The gap in the connector interface may be reduced by introducing adjustable card cage members that are capable of being set during the assembly or manufacturing process using special alignment fixtures. The gap in the connector interface may also be reduced by introducing a higher tolerance capable manufacturing process, such as machining, to the card cage sub-assembly.
    Type: Grant
    Filed: August 20, 2021
    Date of Patent: October 3, 2023
    Assignee: National Instruments Corporation
    Inventors: Richard G. Baldwin, Jr., Dennis Vance Toth
  • Patent number: 11774475
    Abstract: A reflectometer may include two directional couplers in a parallel configuration, sharing the same section of a signal line or through-line. For example, two directional couplers may be disposed across from each other on opposite sides of the shared through-line. One of the directional couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other directional coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss with respect to reflectometers having a serial configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.
    Type: Grant
    Filed: July 13, 2021
    Date of Patent: October 3, 2023
    Assignee: National Instruments Corporation
    Inventors: Justin Regis Magers, Michael Joseph Seibel, Marcus Kieling daSilva
  • Publication number: 20230283516
    Abstract: A method of orchestrating measurements in a measurement system includes configuring a first service with a first configuration for acquiring measurement data by an orchestrator. The method also includes receiving a moniker generated by the first service in response to being configured that represents the first configuration. The moniker includes a location of the first service and an identifier of the first configuration. The method also includes transferring the moniker to a second service configured to establish communication with the first service based on the location, consume the measurement data acquired by the first service using the first configuration and transmitted in response to receiving the identifier from the second service, and generate a result in response to receiving the measurement data from the first service. The method further includes receiving the result from the second service.
    Type: Application
    Filed: March 2, 2023
    Publication date: September 7, 2023
    Applicant: National Instruments Corporation
    Inventor: Christopher George Cifra
  • Patent number: 11736129
    Abstract: Methods and wireless devices for selecting a local oscillator frequency to use for conducting orthogonal frequency division multiplexing (OFDM) communications. For each of a plurality of local oscillator frequencies, a wireless device determines a respective interference power resultant from the local oscillator frequency for each of a plurality of subcarriers, and determines a cost function by performing a summation over the interference powers associated with each of the plurality of subcarriers. The wireless device selects a first local oscillator frequency with the smallest cost function to use for wireless communications. The wireless device performs wireless communications through the plurality of subcarriers using the first local oscillator frequency.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: August 22, 2023
    Assignee: National Instruments Corporation
    Inventor: Karl F. Nieman
  • Patent number: 11726190
    Abstract: A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: August 15, 2023
    Assignee: National Instruments Corporation
    Inventors: Jason Marks, Marcus Kieling daSilva
  • Patent number: 11704269
    Abstract: Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.
    Type: Grant
    Filed: April 27, 2021
    Date of Patent: July 18, 2023
    Assignee: National Instruments Corporation
    Inventors: Eric L. Singer, Jason W. Frels, Jonathan W. Hearn
  • Publication number: 20230114555
    Abstract: Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
    Type: Application
    Filed: October 13, 2021
    Publication date: April 13, 2023
    Applicant: National Instruments Corporation
    Inventors: James C. Nagle, Stephen Thung, Sergey Kizunov, Shaul Teplinsky
  • Patent number: 11604747
    Abstract: Systems and methods for communication between heterogenous processors via a virtual network interface implemented via programmable hardware and one or more buses. The programmable hardware may be configured with a multi-function bus such that the programmable hardware appears as both a network device and a programmable device to a host system. Additionally, the programmable hardware may be configured with a second bus to appear as a network device to an embedded system. Each system may implement network drivers to allow access to direct memory access engines configured on the programmable hardware. The configured programmable hardware and the network drivers may enable a virtual network connection between the systems to allow for information transfer via one or more network communication protocols.
    Type: Grant
    Filed: September 28, 2020
    Date of Patent: March 14, 2023
    Assignee: National Instruments Corporation
    Inventors: Patrick Karl Sisterhen, Ashish S. Chaudhari, Moritz Daniel Fischer, Daniel Paul Jepson, Hector M. Rubio, Andrew Michael Lynch, Klaus Martin Braun, Antonia Marie Walls Jones
  • Patent number: 11595109
    Abstract: A user equipment device (UE) determines a beam coherence interval metric, which is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a receive beam of the UE and a transmit beam of a base station transmitting to the UE. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE also determines a hysteresis value based on the beam coherence interval metric and uses the hysteresis value to decide to switch from an active receive beam to a different receive beam that has a signal quality higher than the active receive beam by at least the hysteresis value. Alternatively, the base station determines and sends the UE the hysteresis value.
    Type: Grant
    Filed: May 10, 2022
    Date of Patent: February 28, 2023
    Assignee: National Instruments Corporation
    Inventors: Nikhil U. Kundargi, Venkata Siva Santosh Ganji, Ahsan Aziz, James Wesley McCoy
  • Patent number: 11515950
    Abstract: A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: November 29, 2022
    Assignee: National Instruments Corporation
    Inventors: Martin Laabs, Dirk Plettemeier, Thomas Deckert, Johannes Dietmar Herbert Lange, Marc Vanden Bossche
  • Patent number: 11452231
    Abstract: Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: September 20, 2022
    Assignee: National Instruments Corporation
    Inventors: Richard G. Baldwin, Jr., Michael H. Singerman