Patents Assigned to National Semiconductgor
  • Method of locating failure site on semiconductor device under test
    Patent number: 7928748
    Abstract: In an analysis of a semiconductor device under test (DUT) using a Thermal Induced Voltage Alteration (TIVA) tool, the TIVA is connected to an output of the DUT and the DC component on the output is decoupled from the TIVA. The remaining AC component from the output is analyzed by the TIVA while scanning the DUT with a scanning laser to identify locations on the DUT that produce signal anomalies at the DUT output.
    Type: Grant
    Filed: August 22, 2008
    Date of Patent: April 19, 2011
    Assignee: National Semiconductgor
    Inventors: Fayik Bundhoo, William Ng