Abstract: The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, comprising: a high-throughput preparation module, a high-throughput characterization module, an automatic control module and a statistical mapping data processing module; the high-throughput preparation module is used for preparing a multi-component combinatorial-sample; the high-throughput characterization module comprises a plurality of different high-throughput characterization devices; the automatic control module comprises a special sample box, a sample moving platform, an intelligent mechanical arm and a synchronous control system; and the statistical mapping data processing module is used for constructing a statistical mapping constitutive model corresponding to position mapping according to the composition, microstructure and performance data of the combinatorial-sample.

Abstract: An apparatus and a method for preparing glow discharge sputtering samples for materials microscopic characterization are provided. The apparatus includes a glow discharge sputtering unit, a glow discharge power supply, a gas circuit automatic control unit, a spectrometer, and a computer. The structure of the glow discharge sputtering unit is optimized to be more suitable for sample preparation by simulation. By adding a magnetic field to the glow discharge plasma, uniform sample sputtering is realized within a large size range of the sample surface. The spectrometer monitors multi-element signal in a depth direction of the sample sputtering, so that precise preparation of different layer microstructures is realized. In conjunction with the acquisition of the sample position marks and the precise spatial coordinates (x, y, z) information, the correspondence between the surface space coordinates and the microstructure of the sample is conveniently realized.

Abstract: A high-throughput and small size samples tension, compression, bending test system is disclosed. The system includes a computer unit, a motor and a number of the sample testing modules mounted horizontally or perpendicular to that ground on a workbench. The sample testing modules include a sample testing modules base plate fixedly attached to the workbench, and a ball screw, a displacement sensor, a moving beam, a clamp unit, a linear moving platform unit and a force value sensor arranged on the sample testing modules base plate. A number of the sample testing modules are arrange in parallel on the workbench or uniformly distributed in a circumferential direction with a point on the workbench as a circular center.