Patents Assigned to NECTECH COMPANY LIMITED
  • Radiation image inspection system and method based on B/S architecture
    Patent number: 9947067
    Abstract: The present disclosure provides a radiation image inspection system based on B/S architecture.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: April 17, 2018
    Assignees: TSINGHUA UNIVERSITY, NECTECH COMPANY LIMITED
    Inventors: Zhiqiang Chen, Li Zhang, Ziran Zhao, Xianghao Wu, Limin Liu, Min Li, Xiaoming Song, Xinfang Huang, Ying Li