Abstract: The invention relates to an electromagnetic limiter. The limiter comprises a multilayer having an electrically conducting pattern superposed on a dielectric structure. Further, the multilayer is provided with at least one electromagnetically transparent aperture that is electromagnetically transparent for plane wave incidence. In addition, the limiter comprises a non-controlled non-linear structure interconnecting opposite edges of the electromagnetically transparent aperture.
Type:
Application
Filed:
May 28, 2009
Publication date:
June 2, 2011
Applicant:
NEDERLANDSE ORGANISATIE VOORTOEGEPAST NATUURWETENSCHAPPELKJIK ONDERZOEK TNO
Inventors:
Raymond van Dijk, Frank Edward van Vliet, Stefania Monni