Abstract: Apparatus and methods for generating checksums may process two or more segments of a message in parallel, and may be used with a communications channel having time slots. An apparatus may include a cumulative checksum generator to generate a cumulative checksum for a message, a partial checksum generator to generate one or more partial checksums from one or more respective message segments, and a speculative checksum generator to generate a speculative checksum for each of one or more time slots. In one aspect, a partial checksum corresponding with an initial segment of the message may be generated from at least an initialization vector. A speculative checksum selector may select a first speculative checksum for use in determining whether the message was transmitted without error. The generating of partial and speculative checksums results in a maximally pipe-lined architecture with speed limited only by a minimal cumulative CRC calculation that is fundamentally unavoidable.

Abstract: Apparatus and methods for generating checksums may process two or more segments of a message in parallel, and may be used with a communications channel having time slots. An apparatus may include a cumulative checksum generator to generate a cumulative checksum for a message, a partial checksum generator to generate one or more partial checksums from one or more respective message segments, and a speculative checksum generator to generate a speculative checksum for each of one or more time slots. In one aspect, a partial checksum corresponding with an initial segment of the message may be generated from at least an initialization vector. A speculative checksum selector may select a first speculative checksum for use in determining whether the message was transmitted without error. The generating of partial and speculative checksums results in a maximally pipe-lined architecture with speed limited only by a minimal cumulative CRC calculation that is fundamentally unavoidable.

Abstract: A test assembly that may provide access to signals of a circuit that includes an integrated circuit. The test assembly may include structural members that limit movement of components relative to each other.