Patents Assigned to NGK Ceramic Device Ltd.
  • Patent number: 9640749
    Abstract: A piezoelectric/electrostrictive element having a piezoelectric body, a through-hole electrode, a first electrode, a second electrode, a third electrode. The piezoelectric body includes a through-hole in communication with a first main surface and a second main surface. The through-hole electrode is formed on an inner side surface of the through-hole. The first electrode is formed on the first main surface of the piezoelectric body, and connected to the through-hole electrode. The second electrode is formed on the second main surface of the piezoelectric body, and is connected to the through-hole electrode. The third electrode is formed on the second main surface of the piezoelectric body and isolated from the second electrode. A calculated average roughness in the inner side surface is larger than 0.11 microns and smaller than 16 microns. A maximum height roughness in the inner side surface is larger than 0.2 microns and smaller than 20 microns.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: May 2, 2017
    Assignees: NGK Insulators, Ltd., NGK Ceramic Device Ltd.
    Inventors: Shinya Takemura, Takashi Ebigase, Kenichi Tsuge
  • Publication number: 20140292159
    Abstract: A piezoelectric/electrostrictive element has a piezoelectric body, a through-hole electrode, a first electrode, a second electrode, a third electrode. The piezoelectric body includes a through-hole in communication with a first main surface and a second main surface. The through-hole electrode is formed on an inner side surface of the through-hole. The first electrode is formed on the first main surface of the piezoelectric body. The first electrode is connected to the through-hole electrode. The second electrode is formed on the second main surface of the piezoelectric body. The second electrode is connected to the through-hole electrode. The third electrode is formed on the second main surface of the piezoelectric body. The third electrode is isolated from the second electrode. A calculated average roughness in the inner side surface is larger than 0.11 microns and smaller than 16 microns. A maximum height roughness in the inner side surface is larger than 0.2 microns and smaller than 20 microns.
    Type: Application
    Filed: February 26, 2014
    Publication date: October 2, 2014
    Applicants: NGK Ceramic Device Ltd., NGK Insulators, Ltd.
    Inventors: Shinya TAKEMURA, Takashi EBIGASE, Kenichi TSUGE