Patents Assigned to Nidec-Read Corporation
  • Patent number: 11009523
    Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.
    Type: Grant
    Filed: July 7, 2019
    Date of Patent: May 18, 2021
    Assignees: Nidec-Read Corporation, Nidec SV Probe Pte. Ltd.
    Inventors: Minoru Kato, Tadakazu Miyatake, Akio Hayashi, Masaki Naganuma, Matthias Joseph Chin Chieh Chia, Cheng Ghee Ong, Raminderjit Singh
  • Patent number: 10962569
    Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: March 30, 2021
    Assignees: Nidec-Read Corporation, SV Probe Technology Taiwan Co., Ltd.
    Inventors: Michio Kaida, Huei Che Yu
  • Patent number: 10914758
    Abstract: This inspection jig is provided with: an inspection-side support member having a counter plate (51) provided with a facing surface (F) disposed to face the substrate; and an electrode-side support member (6) having supporting plates (61-63) disposed to face an electrode plate (9) located on the side opposite to the facing surface (F) of the counter plate (51) A probe supporting hole (23), into and by which the rear end portion of the probe (Pr) is inserted and supported, is provided in the supporting plates (61-63), and the probe supporting hole (23) is provided with a restricting surface which is formed along a supporting line (V) inclined at a certain angle (?) with respect to a reference line (Z), and which restricts the rear end portion of the probe (Pr) from moving in the direction perpendicular to the inclined direction of the supporting line (V).
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: February 9, 2021
    Assignee: Nidec-Read Corporation
    Inventors: Hidekazu Yamazaki, Norihiro Ota
  • Patent number: 10877069
    Abstract: This inspection jig is provided with: a plurality of probes (Pr) for bringing leading end portions (Pra) thereof into contact with a plurality of inspection points on a substrate (100); a support member (300) that supports the probes (Pr) in a state wherein the leading end portions (Pra) are disposed to be in contact with the inspection points on the substrate (100) respectively; device-side connecting terminals (36) electrically connected to an inspection device main body (2); a plurality of standard disposition electrodes (332), which are conducted to the device-side connecting terminals (36), and are disposed in previously set standard disposition; and a conversion block (31), which has a first surface (311) and a second surface (312) on sides opposite to each other, and in which first electrodes (E1) are formed on the first surface (311), and in which second electrodes (E2) are formed on the second surface (312).
    Type: Grant
    Filed: July 24, 2017
    Date of Patent: December 29, 2020
    Assignee: Nidec-Read Corporation
    Inventor: Norihiro Ota
  • Patent number: 10877085
    Abstract: An inspection jig may include: an electrode; a probe, the probe having a rear end portion and a tip portion to contact a bump; and a support member supporting the probe. The probe may include: an outer tubular body that is electrically conductive; and an inner tubular body that is electrically conductive, the inner tubular body being inserted into the outer tubular body. The outer tubular body may include outer spring parts to bias the rear end portion. The inner tubular body may include inner spring parts. The tip portion may be a first end of the inner tubular body, and protrudes from a first end of the outer tubular body. The support member may hold the outer tubular body such that the rear end portion is brought into contact with the electrode by the biasing force of the outer spring parts.
    Type: Grant
    Filed: April 26, 2017
    Date of Patent: December 29, 2020
    Assignee: NIDEC READ CORPORATION
    Inventors: Toshihiko Kanai, Norihiro Ota, Yusuke Yokota
  • Patent number: 10782317
    Abstract: Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni—P layer, and the Ni—P layer has different concentrations of P at different positions in a thickness direction of the Ni—P layer.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: September 22, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventors: Masami Yamamoto, Norihiro Ota, Shigeki Sakai
  • Patent number: 10761654
    Abstract: A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.
    Type: Grant
    Filed: August 7, 2015
    Date of Patent: September 1, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventors: Tadashi Takahashi, Toshihisa Hibarino, Mutsuhiro Honda
  • Patent number: 10760895
    Abstract: A length measurement device includes: a placement table; cameras imaging images of imaging ranges including target points; first marks within the imaging ranges; a reference position storage unit storing positions of the first marks on a placement surface as first mark reference positions; an image position acquisition unit acquiring, on the basis of the imaged images of the cameras, the target image positions of the target points in the imaged images and the first mark image positions of the first marks in the imaged images; a target position acquisition unit determining positions of the target points on the placement surface on the basis of the target image positions and first mark image positions in the imaged images and the first mark reference positions on the placement surface; and a length acquisition unit determining, on the basis of positions of the target points, the length of a portion to have the length thereof measured.
    Type: Grant
    Filed: September 26, 2017
    Date of Patent: September 1, 2020
    Assignee: Nidec-Read Corporation
    Inventor: Tatsufumi Kusuda
  • Publication number: 20200234860
    Abstract: A coiled electronic component includes: an electronic component body which includes a coil portion having a spiral structure and formed of an electrically conductive material, and electrically conductive connection portions arranged on both ends of the coil portion; and a pair of electrodes for respectively connecting the electrically conductive connection portions to assembly portions arranged on an assembly object. The electrode includes a pair of pinching pieces for pinching the electrically conductive connection portion, and the pair of pinching pieces is opened in a manner that the electrically conductive connection portion is received and fitted therebetween.
    Type: Application
    Filed: February 16, 2018
    Publication date: July 23, 2020
    Applicant: Nidec-Read Corporation
    Inventor: Tatsufumi KUSUDA
  • Publication number: 20200200797
    Abstract: The inspection jig includes a rod-shaped probe in which one end portion is brought into press contact with an inspection target; and a plate-shaped first support having a support hole which supports the probe. The support hole includes a first taper hole portion having a diameter that increases from a side of one wall surface of the first support toward a side of a plate-thickness-direction middle portion of the first support.
    Type: Application
    Filed: December 17, 2019
    Publication date: June 25, 2020
    Applicant: Nidec-Read Corporation
    Inventors: Hidekazu YAMAZAKI, Norihiro OTA
  • Patent number: 10678385
    Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.
    Type: Grant
    Filed: August 18, 2017
    Date of Patent: June 9, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventors: Koji Sakamoto, Toshihide Matsukawa, Koji Iwami, Shigeki Fujita, Osamu Hikita
  • Patent number: 10656179
    Abstract: A contact terminal defined by a probe may include a tubular body made of an electrically conductive material and central conductors, each of which is made of an electrically conductive material and has a stick shape. The central conductors and may include stick-shaped bodies inserted into the tubular body. The tubular body may include spring portions, which are defined by helical bodies formed by helical grooves along a circumference thereof and clasping portions, which are fitted onto proximal end portions of the stick-shaped bodies to fit the proximal end portions. The clasping portions may be defined by a circumferential wall of the tubular body and a slit extending from end portions of the helical grooves, which define the spring portions, in an axial direction of the tubular body, at which, portions are separated in a circumferential direction of the tubular body.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: May 19, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventor: Norihiro Ota
  • Patent number: 10649005
    Abstract: A contact terminal may include an outer tubular body being tubular and conductive and an inner tubular body being tubular and conductive, that is inserted into a cylinder of the outer tubular body. An outer first spring part that is elastic in an axial direction of the outer tubular body and whose winding direction is a first direction to be formed into a helical shape, may be formed on the outer tubular body. An inner first spring part that is elastic in an axial direction of the inner tubular body and whose winding direction is a second direction that is opposite to the first direction to be formed into a helical shape, may be formed on the inner tubular body.
    Type: Grant
    Filed: January 16, 2017
    Date of Patent: May 12, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventor: Norihiro Ota
  • Patent number: 10649004
    Abstract: A contact terminal may include a tubular body made of an electrically conductive material; and stick-shaped first and second central conductors made of an electrically conductive material. The first and second central conductors may include first and second stick-shaped bodies, first and second clasped portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies, and first and second swell portions configured to have a diameter greater than that of each of the first and second stick-shaped bodies. The first and second central conductors are arranged to have a distal end portion of the first and second swell portions inserted into a joining portion of the tubular body, and to have a distal end surface of the first swell portion and a distal end surface of the second swell portion opposite each other with a gap therebetween.
    Type: Grant
    Filed: July 3, 2018
    Date of Patent: May 12, 2020
    Assignee: NIDEC-READ CORPORATION
    Inventor: Norihiro Ota
  • Publication number: 20200041543
    Abstract: A probe structure is provided with: a holding plate which has a first surface and a second surface in which at least the first surface is insulated; a plurality of electrodes which are formed on the first surface of the holding plate in such a state that the plurality of electrodes is separated from each other; and carbon nanotube structures which are erected on the electrodes 3. The holding plate is provided with through holes which correspond to the electrodes, respectively.
    Type: Application
    Filed: March 14, 2018
    Publication date: February 6, 2020
    Applicant: Nidec-Read Corporation
    Inventors: Michihisa MAEDA, Kiyoshi NUMATA, Hidekazu YAMAZAKI, Makoto FUJINO
  • Publication number: 20200018779
    Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.
    Type: Application
    Filed: July 7, 2019
    Publication date: January 16, 2020
    Applicants: Nidec-Read Corporation, Nidec SV Probe Pte. Ltd.
    Inventors: Minoru KATO, Tadakazu MIYATAKE, Akio HAYASHI, Masaki NAGANUMA, Matthias Joseph Chin Chieh Chia, Cheng Ghee Ong, Raminderjit Singh
  • Publication number: 20200018590
    Abstract: A length measurement device is provided with includes: a placement table; cameras imaging images of imaging ranges including target points; first marks within the imaging ranges; a reference position storage unit storing positions of the first marks on a placement surface as first mark reference positions; an image position acquisition unit acquiring, on the basis of the imaged images of the cameras, the target image positions of the target points in the imaged images and the first mark image positions of the first marks in the imaged images; a target position acquisition unit determining positions of the target points on the placement surface on the basis of the target image positions and first mark image positions in the imaged images and the first mark reference positions on the placement surface; and a length acquisition unit determining, on the basis of positions of the target points, the length of a portion to have the length thereof measured.
    Type: Application
    Filed: September 26, 2017
    Publication date: January 16, 2020
    Applicant: Nidec-Read Corporation
    Inventor: Tatsufumi KUSUDA
  • Publication number: 20190353684
    Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
    Type: Application
    Filed: May 16, 2019
    Publication date: November 21, 2019
    Applicants: Nidec-Read Corporation, SV Probe Technology Taiwan Co., Ltd.
    Inventors: Michio KAIDA, Huei Che Yu
  • Publication number: 20190302170
    Abstract: An inspection jig may include: an electrode; a probe, the probe having a rear end portion and a tip portion to contact a bump; and a support member supporting the probe. The probe may include: an outer tubular body that is electrically conductive; and an inner tubular body that is electrically conductive, the inner tubular body being inserted into the outer tubular body. The outer tubular body may include outer spring parts to bias the rear end portion. The inner tubular body may include inner spring parts. The tip portion may be a first end of the inner tubular body, and protrudes from a first end of the outer tubular body. The support member may hold the outer tubular body such that the rear end portion is brought into contact with the electrode by the biasing force of the outer spring parts.
    Type: Application
    Filed: April 26, 2017
    Publication date: October 3, 2019
    Applicant: NIDEC READ CORPORATION
    Inventors: Toshihiko KANAI, Norihiro OTA, Yusuke YOKOTA
  • Patent number: D894025
    Type: Grant
    Filed: November 16, 2018
    Date of Patent: August 25, 2020
    Assignees: NIDEC-READ CORPORATION, SV PROBE TECHNOLOGY TAIWAN CO., LTD.
    Inventors: Michio Kaida, Huei Che Yu