Abstract: A transparent substrate with a multilayer antireflection film having electrical conductivity is disclosed. On a polycarbonate substrate (a refractive index of 1.58) with a hard coat, a first thin-film layer whose main component is SiO2 is formed with a thickness of 142.5 nm (approx. &lgr;/4 for a wavelength of 550 nm). A second thin-film layer whose main component is TiO2 is formed with a thickness of 124.0 nm on the first thin-film layer. Furthermore, a third thin-film layer whose main component is indium tin oxide (ITO) is formed with a thickness of 150.0 nm on the second thin-film layer.