Patents Assigned to Ningbo Focus-ebeam Instruments Inc.
  • Scanning transmission electron microscope with variable axis objective lens and detective system
    Patent number: 9613779
    Abstract: The present invention provides a scanning transmission electron microscope (STEM). In the STEM, a specimen is sandwiched between a variable axis objective lens and a variable axis collection lens. The axis of the collection lens varies along with the variation of the objective lens axis in a coordinated manner. The STEM of the invention exhibits technical merits such as large scanning field, high image resolution across the entire scanning field, and high throughput, among others.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: April 4, 2017
    Assignee: NINGBO FOCUS-EBEAM INSTRUMENTS INC.
    Inventors: Shuai Li, Wei He, Zhongwei Chen
  • SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH VARIABLE AXIS OBJECTIVE LENS AND DETECTIVE SYSTEM
    Publication number: 20160351371
    Abstract: The present invention provides a scanning transmission electron microscope (STEM). In the STEM, a specimen is sandwiched between a variable axis objective lens and a variable axis collection lens. The axis of the collection lens varies along with the variation of the objective lens axis in a coordinated manner. The STEM of the invention exhibits technical merits such as large scanning field, high image resolution across the entire scanning field, and high throughput, among others.
    Type: Application
    Filed: November 12, 2015
    Publication date: December 1, 2016
    Applicant: Ningbo Focus-ebeam Instruments Inc.
    Inventors: Shuai Li, Wei He, Zhongwei Chen