Abstract: Methods for direct measurements of quantum relaxation time of electrons in a metal or conducting semiconductor, and of electron scattering rate of photo-induced carriers and other transport properties in intrinsic wide-bandgap semiconductors, through optical measurements. The measurement includes measuring complex dielectric function and calculating the imaginary part of the complex dielectric loss function - Im ? ( 1 ? ? ( ? ) ) . The - Im ? ( 1 ? ? ( ? ) ) curve is analyzed to identify resonance peaks, and the peak position, peak height, and peak width are used to determine the screened plasma frequency ?s, background dielectric polarizability Ec(G0s), and equivalent optical quantum relaxation time ?0 (?s) or equivalent optical electron scattering rate ?0(?s), respectively.

Abstract: The invention discloses a apparatus and a method for rapid measurement of heat capacity of a thin film material. Specifically, the apparatus comprises a control device, a clock synchronizer, a flat peak laser device, a rapid thermometer and a heat capacity output device; the control device and the clock synchronizer are signally connected, and the clock synchronizer is signally connected to the flat peak laser device and the rapid thermometer; In the working state, the control device sends a start signal to the clock synchronizer, and the flat peak laser device and the fast thermometer coordinately cooperate; the flat peak laser device irradiates a laser with a spatially flat peak to the surface of the sample; At the same time, the rapid thermometer captures the surface temperature of the sample at a certain point in time during the heating process of the sample, and inputs the measured data into the heat capacity output device to obtain the desired heat capacity parameter.

Abstract: A method and apparatus for rapid measurement and analysis of structure and composition of poly-crystal materials by X-ray diffraction and X-ray spectroscopy, which uses a two-dimensional energy dispersive area detector having an array of pixels, and a white spectrum X-ray beam source. A related data processing method includes separating X-ray diffraction and spectroscopy signals in the energy dispersive X-ray spectrum detected by each pixel of the two-dimensional energy dispersive detector; correcting the detected X-ray diffraction signals by a correction function; summing the corrected X-ray diffraction signals and X-ray spectroscopy signals, respectively, over all pixels to obtain an enhanced diffraction spectrum and an enhanced spectroscopy spectrum; using the enhanced diffraction and spectroscopy spectrum respectively to determine the structure and composition of the sample.