Abstract: A sample chip analyzing device includes a waveguide plate which entirely reflects and guides incident light and has a number of sampling probes that are connectable to a sample to be analyzed, a light source which irradiates fluorescent pumping light onto an end face of an end portion of the waveguide plate that is inserted into a light-shielding box, and a pickup member which picks up an image of substantially an entire surface of the waveguide plate. The sample to be analyzed is labeled with fluorescent substances that are fluorescence-pumped by an evanescent wave which occurs when the fluorescent pumping light enters into an interior of the waveguide to be entirely reflected and guided, and the sample is analyzed by detecting respective ones of the sampling probes that are coupled to the fluorescence-pumped flourescent substances of the labeled sample, based on data outputted by the pickup member.
Abstract: The present invention is object to provide a protein chip holding tool that is capable of effectively executing analysis work by preventing protein from being denatured and/or inactivated due to drying while attempting to make the amount of spotting of protein test samples to be spotted on a substrate very slight, and said a chip holding tool comprising a substrate holding member 39 in which at least one or more substrate holding portions 41 holding the substrate 35, a resilient holding member 45 that covers the upper surface of the substrate holding member 39, a resilient body engaging portion 51 holding the resilient body 37, and an opening and closing member 53 that is movably supported on the upper surface of the resilient holding member 45 and opens and closes the openings 45a.
Abstract: In an apparatus for evaluating an anisotropic thin film, an optical system generates a light beam having a predetermined diameter and polaraization state to project the light beam as incident light into a thin film sample corresponding to the anisotropic thin film. An analyzer is disposed at an optically down stream side of the thin film sample. At an optically down stream side of the analyzer, a two-dimensional photo-intensity detector is disposed to detect reflected light, obtained from the thin film sample, through the analyzer. The detector produces a light intensity distribution. On the basis of the light intensity distribution, an evaluating unit evaluates an inplane distribution of an optical anisotropy of the thin film sample.
Type:
Grant
Filed:
March 23, 2001
Date of Patent:
November 26, 2002
Assignees:
NEC Corporation, Nippon Laser & Electronics Lab.
Abstract: The Invention provides a sample chip analyzing device and a method for analyzing the sample chip, which are capable of detecting, at high accuracy, fluorescence from marked fluorescent substances of a sample to be analyzed, which have been coupled to a sampling probe, without being influenced by pumping light of the fluorescent substance and disturbance light (noise), and efficiently analyzing the sample to be analyzed.
Abstract: A helical structure with a high toughness includes a number of helical elements as an artificial substitute for collagen filament constituting a biological tissue, which can be easily exchanged for a part so as to permanently extend the service life, and which can be easily assembled into a required structure and vice versa. The helical elements are made of wiry materials with a predetermined diameter helically wound with a predetermined lead and pitch so that the diameter of the helix of the helical elements is about two times that of the wiry material. The form of the crest of the structure may correspond with that of the trough, and the trough may be located outside the center of the helix. A number of the helical elements are collectively solidified with their mutual troughs and crests united side by side.