Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.
Type:
Grant
Filed:
December 20, 2022
Date of Patent:
November 3, 2026
Assignee:
NLIGN ANALYTICS, INC.
Inventors:
Joseph M. Kesler, Thomas D. Sharp, Uriah M. Liggett, Brian Bahr, Chris M. Hodapp, Gary E. Coyan