Patents Assigned to NMB Technologies Corporation
  • Patent number: 10622125
    Abstract: A strain gauge includes a substrate having a surface, a resistor pattern provided on the surface of the substrate, and an adjusting part. The resistor pattern has a pair of terminals, and grid lines coupled to each other in series and forming a zigzag pattern coupled between the pair of terminals. The adjusting part is provided on the zigzag pattern, and includes trim resistors coupled in parallel to one of the grid lines. The trim resistors are arranged at intervals along a direction in which the one of the grid lines of the zigzag pattern extends, and have mutually different lengths along the one of the grid lines of the zigzag pattern.
    Type: Grant
    Filed: March 7, 2019
    Date of Patent: April 14, 2020
    Assignee: NMB Technologies Corporation
    Inventor: Satoshi Ogawa