Patents Assigned to Nokomis, Inc.
  • Patent number: 12638499
    Abstract: A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture by analysis of emission metrics.
    Type: Grant
    Filed: January 21, 2024
    Date of Patent: May 26, 2026
    Assignee: Nokomis, Inc.
    Inventors: Todd Eric Chornenky, James Robert Uplinger, II, Andrew Richard Portune, Walter J. Keller, III
  • Publication number: 20260081386
    Abstract: An apparatus configured to acquire unintended emissions from a conductor passed through an opening in a toroid and electrically and mechanically connected to at least one connector. The apparatus includes an enclosure for RF shielding or physical protection of the ether. An RF connector is electrically and mechanically connected to ends of the toroid winding to carry a voltage from the electromagnetic field generated at the core. Connectors facilitate easy and secure connections with electrical devices and RF analysis equipment.
    Type: Application
    Filed: September 12, 2025
    Publication date: March 19, 2026
    Applicant: Nokomis, Inc.
    Inventors: Walter J. Keller, III, VINCENT FENG, TODD ERIC CHORNENKY
  • Publication number: 20260063700
    Abstract: Specific algorithmic methods are disclosed herein whereby the accumulated degradation or Remaining Useful Life (RUL) of an electrical semiconductor-based device or subsystem may be determined based on examining unintended RF emissions from the device or a subsystem while it is operating on a periodic, sporadic, or one-time basis. The methods may be then preferably combined to provide an accurate assessment and prediction of degree of its degradation or RUL. These assessments or predictions may be practical for more accurately allocating maintenance or replacement practices, especially for safety-critical systems. These assessments or predictions may be presented in an understandable, useful, comprehensive, more definitive, more detailed, or alternatively simpler format depending on the user's needs.
    Type: Application
    Filed: August 7, 2024
    Publication date: March 5, 2026
    Applicant: Nokomis, Inc.
    Inventors: Walter J. Keller, III, Kenneth H. Munson, Jr.
  • Patent number: 12445461
    Abstract: A method for detecting, in a real-time manner, a presence or an absence of a an anomaly in or a cyber attack onto a medical apparatus comprises the steps of capturing, with an antenna, one or more emissions of electromagnetic energy from the processing devices within medical apparatus; converting, with a receiver coupled to the antenna, the one or more emissions from an analog to a digital form; generating, with a controller, a digital signal in a time domain; converting, the digital signal from the time domain to a frequency domain, the digital signal containing a signature of cross modulation products from the non-linear attachments; processing, in the frequency domain, the signature of cross modulation products to determine mixing characteristics of the cross modulation products; and detecting, based on the mixing characteristics, the absence or the presence of the anomaly or the cyber attack.
    Type: Grant
    Filed: October 13, 2022
    Date of Patent: October 14, 2025
    Assignee: NOKOMIS, INC.
    Inventors: James Robert Uplinger, II, Walter J. Keller, III, Adam Brant
  • Patent number: 12379329
    Abstract: A rapid virus and pathogen detector using RF and Dielectric Spectroscopy. The targeted virus or pathogen is identified by active illumination by RF energy and analysis of the response RF signal.
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: August 5, 2025
    Assignee: Nokomis, Inc.
    Inventors: Walter J Keller, III, James Robert Uplinger, II, Vladimir Makarenko
  • Publication number: 20250244107
    Abstract: A flexible multi-layered film with a printed deceptive image that mimics in the visual and infrared spectrum a landscape and/or an object. The image layer has an edge portion that has an irregularly cut pattern, that is lightened, and made transparent to blend into the surrounding environment and eliminate shadows. The image layer also has a variable concentration of a metal or high emissivity ink image and a color ink image. The film base layer is a thermal emitter and the intermediate layer has thermally conductive properties. The infrared radiation is transmitted or conducted to the metal or high emissivity ink image to provide a deceptive thermal signature.
    Type: Application
    Filed: March 4, 2025
    Publication date: July 31, 2025
    Applicant: NOKOMIS, INC.
    Inventor: Joel B. Rovner
  • Publication number: 20250052810
    Abstract: A method includes the steps of energizing, in a test fixture with a combination of a power signal and a clock signal, an electrical device selected from a plurality of electrical devices, measuring a first value of a parameter of the electrical device in a first emission of an electromagnetic energy in a radio frequency (RF) spectrum emitted from energized electrical device, irradiating the electrical device, irradiating the electrical device with a radiation dose in a radiation type, measuring a second value of the parameter in the second emission of the electromagnetic energy in the RF spectrum emitted from the energized and irradiated electrical device, measuring a difference between the first value and the second value, and determining a condition of the electrical device based on a measured difference.
    Type: Application
    Filed: June 3, 2024
    Publication date: February 13, 2025
    Applicant: Nokomis, Inc.
    Inventors: Walter J. Keller, III, Kenneth H. Munson, JR., Anastazia Polakovsky
  • Publication number: 20250007160
    Abstract: A sensor configured to determine a condition of an electrical device may include an antenna, a receiver and a controller designed to implement a method. The method of determining a condition of an electrical device may include selecting a plurality of singular dimensional components of a multi-dimensional signal of a radio frequency (RF) emission from an electrical device, extracting singular dimensional components individually or as a combination, inputting each individual extracted singular dimensional component or the combination of the components into a neural network (NN), and analyzing, with NN, outputs from the inputted singular dimensional component(s). Singular-spectrum analysis (SSA) and/or wavelet transform may be used to select components.
    Type: Application
    Filed: July 5, 2024
    Publication date: January 2, 2025
    Applicant: Nokomis, Inc.
    Inventors: KAREN HEIKE SPIELER CANNE, JENNTING TIMOTHY HSU, VLADIMIR MAKARENKO
  • Publication number: 20240410940
    Abstract: A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture by analysis of emission metrics.
    Type: Application
    Filed: January 21, 2024
    Publication date: December 12, 2024
    Applicant: NOKOMIS, INC.
    Inventors: TODD Eric Chornenky, JAMES ROBERT UPLINGER, II, ANDREW RICHARD PORTUNE, WALTER J. KELLER, III
  • Publication number: 20240356196
    Abstract: A diagnostic apparatus for analysis, testing, inspecting and/or screening an integrated and assembled electrically powered equipment rack and its populated cards and devices for measurement of degree of device aging, improper operation, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an antenna card with a detachably attachable antenna module that can be positioned at a distance from the electrically devices under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to rackmount supported electronics and/or chassis based electronics. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.
    Type: Application
    Filed: June 27, 2024
    Publication date: October 24, 2024
    Applicant: Nokomis, Inc.
    Inventor: Walter J. Keller, III
  • Publication number: 20240353463
    Abstract: An apparatus configured to assess health of electronic components in vehicles. This may be achieved by simply driving a vehicle into or through a physical device or over a physical device and determining the health of the vehicle. The apparatus may be comprised of a physical enclosure with antennas and a RF emission or other electromagnetic emission signature analyzer. The antennas capture unintended electronic emissions from the vehicle which provide the electromagnetic signatures of the electronic component to the signature analyzer. The evolution of the unintended electromagnetic emissions signature as the electronics ages is measured and evaluated, providing a measure of the health of the electronics within the vehicle. The apparatus may have an ultra-sensitive RF collection portion with a sensitivity preferably of at least ?150 dBm. The RF collection portion may measure bandwidths of at least 100 MHz and may have a frequency resolution of 1 Hz or better.
    Type: Application
    Filed: June 25, 2024
    Publication date: October 24, 2024
    Applicant: Nokomis, Inc.
    Inventor: Alexander Keller
  • Patent number: 12117476
    Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.
    Type: Grant
    Filed: August 21, 2023
    Date of Patent: October 15, 2024
    Assignee: Nokomis, Inc.
    Inventors: Walter J. Keller, III, Andrew Richard Portune, Todd Eric Chornenky, William Anthony Davis
  • Patent number: 12068544
    Abstract: A sensor configured to determine a condition of an electrical device may include an antenna, a receiver and a controller designed to implement a method. The method of determining a condition of an electrical device may include selecting a plurality of singular dimensional components of a multi-dimensional signal of a radio frequency (RF) emission from an electrical device, extracting singular dimensional components individually or as a combination, inputting each individual extracted singular dimensional component or the combination of the components into a neural network (NN), and analyzing, with NN, outputs from the inputted singular dimensional component (s). Singular-spectrum analysis (SSA) and/or wavelet transform may be used to select components.
    Type: Grant
    Filed: May 18, 2021
    Date of Patent: August 20, 2024
    Assignee: NOKOMIS, INC.
    Inventors: Karen Heike Spieler Canne, Jennting Timothy Hsu, Vladimir Makarenko
  • Patent number: 12050242
    Abstract: An apparatus configured to assess health of electronic components in vehicles. This may be achieved by simply driving a vehicle into or through a physical device or over a physical device and determining the health of the vehicle. The apparatus may be comprised of a physical enclosure with antennas and a RF emission or other electromagnetic emission signature analyzer. The antennas capture unintended electronic emissions from the vehicle which provide the electromagnetic signatures of the electronic component to the signature analyzer. The evolution of the unintended electromagnetic emissions signature as the electronics ages is measured and evaluated, providing a measure of the health of the electronics within the vehicle. The apparatus may have an ultra-sensitive RF collection portion with a sensitivity preferably of at least ?150 dBm. The RF collection portion may measure bandwidths of at least 100 MHz and may have a frequency resolution of 1 Hz or better.
    Type: Grant
    Filed: September 20, 2021
    Date of Patent: July 30, 2024
    Assignee: Nokomis, Inc.
    Inventor: Alexander Keller
  • Patent number: 12040531
    Abstract: A diagnostic apparatus for analysis, testing, inspecting and/or screening an integrated and assembled electrically powered equipment rack and its populated cards and devices for measurement of degree of device aging, improper operation, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an antenna card with a detachably attachable antenna module that can be positioned at a distance from the electrically devices under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to rackmount supported electronics and/or chassis based electronics. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.
    Type: Grant
    Filed: June 23, 2021
    Date of Patent: July 16, 2024
    Assignee: NOKOMIS, INC.
    Inventor: Walter J. Keller, III
  • Patent number: 11936766
    Abstract: A receiver includes a circuit designed to process, based on a plurality of timed waveform reference locations, a waveform signal, the waveform signal comprising a message. The circuit may include a clock source, an input configured to receive the waveform signal, a time location reference circuit coupled to the clock source, the time location reference circuit designed to output the plurality of timed waveform reference locations, each timed waveform reference location being set by the clock, and a signal processing circuit coupled to the time location reference circuit, the signal processing circuit designed to generate an output voltage in a response to the waveform signal being inputted into the signal processing circuit through the input and processed at each timed waveform reference location from the series of timed waveform reference locations. A transmitter that generates the waveform signal can be also provided where the clocks are matched.
    Type: Grant
    Filed: September 8, 2022
    Date of Patent: March 19, 2024
    Assignee: NOKOMIS, INC.
    Inventor: Todd Eric Chornenky
  • Publication number: 20240044963
    Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.
    Type: Application
    Filed: August 21, 2023
    Publication date: February 8, 2024
    Applicant: Nokomis, Inc.
    Inventors: Walter J. Keller, III, Andrew Richard Portune, Todd Eric Chornenky, William Anthony Davis
  • Patent number: 11879935
    Abstract: A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture within a shielded enclosure by analysis of emission metrics. The testing fixture can include a first layer with a capacitive member and a second layer with a cavity to receive a microelectronic part. A filter in a transmission chain can pass a high power signal to the fixture. A filter in a receving chain can pass a low power signal to the analysis unit.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: January 23, 2024
    Assignee: NOKOMIS, INC.
    Inventors: Todd Eric Chornenky, James Robert Uplinger, II, Andrew Richard Portune, Walter J Keller, III
  • Patent number: 11733283
    Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.
    Type: Grant
    Filed: April 26, 2021
    Date of Patent: August 22, 2023
    Assignee: Nokomis, Inc.
    Inventors: Walter John Keller, III, Andrew Richard Portune, Todd Eric Chornenky, William Anthony Davis
  • Publication number: 20230097993
    Abstract: A method for detecting, in a real-time manner, a presence or an absence of a an anomaly in or a cyber attack onto a medical apparatus comprises the steps of capturing, with an antenna, one or more emissions of electromagnetic energy from the processing devices within medical apparatus; converting, with a receiver coupled to the antenna, the one or more emissions from an analog to a digital form; generating, with a controller, a digital signal in a time domain; converting, the digital signal from the time domain to a frequency domain, the digital signal containing a signature of cross modulation products from the non-linear attachments; processing, in the frequency domain, the signature of cross modulation products to determine mixing characteristics of the cross modulation products; and detecting, based on the mixing characteristics, the absence or the presence of the anomaly or the cyber attack.
    Type: Application
    Filed: October 13, 2022
    Publication date: March 30, 2023
    Applicant: NOKOMIS, INC.
    Inventors: JAMES ROBERT UPLINGER, II, WALTER J. KELLER, III, ADAM BRANT