Abstract: An object is to provide a delamination inspection method and a delamination inspection apparatus capable of easily and distinctly detecting an inter-layer delamination of a laminated body even when an obstacle such as a reinforcing plate is present on a part to be inspected, and capable of inspecting a wide inspection area in a short time. The apparatus includes: a transmission probe 2a that causes an ultrasonic wave to enter a laminated body 10 at a predetermined refraction angle ?; a reception probe 2b that receives a propagation wave having propagated while having been repeatedly reflected by interfaces of a plurality of members; and a probe holding means that holds the transmission probe 2a and the reception probe 2b with a predetermined interval L therebetween.
Type:
Grant
Filed:
April 5, 2017
Date of Patent:
October 1, 2019
Assignee:
NON-DESTRUCTIVE INSPECTION COMPANY LIMITED.
Inventors:
Satoru Shiroshita, Ryusuke Tanaka, Masashi Mori
Abstract: An ultrasonic wave propagating method capable of propagating plate waves between a probe and a test piece despite variations in the thickness or the surface angle of a test piece, and an ultrasonic propagating device and an ultrasonic testing device using this method. Ultrasonic waves are propagated between a probe (20) for transmitting or receiving ultrasonic waves and a test piece (100) for propagating plate waves. When propagating ultrasonic waves, a probe that can set an ultrasonic wave incident angle from the probe (20) to the test piece (100) and/or an ultrasonic wave receivable angle from the test piece to the probe in a plurality of states is used. A focal point type probe may be used as the above probe (20).
Type:
Grant
Filed:
June 30, 2006
Date of Patent:
July 24, 2012
Assignees:
Independent Administrative Institution Japan Aerospace Exploration Agency, Non-Destructive Inspection Company Limited
Abstract: An ultrasonic wave is sent from a transmission element to a test element to produce a plate wave in the test element, and the plate wave propagating through the test element is received by a reception element to thereby test the test element on the propagation route of the plate wave. The other probe that is the other reception element or transmission element is disposed between the transmission element and the reception element. A probe holding mechanism that has support legs contacting the surface of the test element and keeps constant an angle of the other probe with respect to the surface of the test element is allowed to support the other probe. And, the other probe is allowed to cross over in non-contact the propagation route of the plate wave extending from the transmission element to the reception element by means of support legs.
Type:
Grant
Filed:
June 30, 2006
Date of Patent:
September 27, 2011
Assignees:
Independent Administrative Institution Japan Aerospace Exploration Agency, Non-Destructive Inspection Company Limited