Patents Assigned to Nonius B.V.
  • Patent number: 6411676
    Abstract: A method for determining the parameters of a unit cell of a crystal structure using diffraction is presented. The method includes the steps of repeatedly rotating the crystal at a predetermined angle, while the crystal moves in relation to a detection surface and measuring the position of radiation reflected from the crystal. The resulting combined measurements are utilized to accurately determine the unit cell dimension and orientation of the crystal.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: June 25, 2002
    Assignee: Nonius B.V.
    Inventors: Robertus Wilhelmus Hooft, Albert Jozef Duisenberg, Antonius Matthias Schreurs