Abstract: A test slide for the calibration, characterization, standardization, use and study of photon and electron microscopes. The slide is created by forming patterns with specific types of geometries on suitable substrates and these slides provide a standard for comparison of image forming capability of any type of microscope imaging system including, without limitation, light, UV, and X-ray photon microscopical imaging systems operating in transmission or reflection modes, and other microscope techniques. Microscopists can employ one of these slides to compare images of the slide which have been produced by the microscope system under consideration with a known, accurate, image of the slide to better understand the fidelity and accuracy of the microscope system under consideration. The test patterns can also comprise reference images which can be images created by a graphic artist or the like or which can be actual images of samples, these images being either two dimensional or three dimensional.

Abstract: A slide system allowing rapid, sterile, clean and safe preparation and use of microscope slides containing sample materials including living and/or hazardous preparations or samples. In one embodiment, the system comprises a slide base and cover slip which are preferably pre-cleaned and supplied in a sterile wrapper. The cover slip, slide base or both have an adhesive coating that surrounds a sample area to adhere the cover slip to the slide base, thereby creating a sealed sample area or chamber that is defined by the slide, the cover slip, and the adhesive. In another embodiment, the slide base has one or two grooves or depressions in the surface of the slide base positioned within the sample area, the grooves or depressions accommodating extra or expanding sample material to prevent loss of the sample material into the environment and prevent damage to the adhesive and/or cover slip.