Abstract: A method of testing circuit chips includes providing test chips, the test chips being circuit chips to be tested, emulating a first type of test handler positioner for a circuit chip coupling device that is configured to couple to the first type of test handler, and using a test handler positioner connected to the circuit chip coupling device to couple the circuit chip coupling device to a selected test chip, to move the test chip to a desired test location, and to remove the test chip from the test location.
Type:
Grant
Filed:
July 14, 2004
Date of Patent:
November 28, 2006
Assignee:
Northwave Equipment Corporation
Inventors:
Mark E. Clemons, C. Kenneth Gray, James D. Roblee