Patents Assigned to Nova
  • Patent number: 12180560
    Abstract: The present invention relates to a solid-liquid-solid hydrometallurgical method in the presence of hydrated and/or non-hydrated salts in an oversaturation conditions, which is achieved by the intentional and repetitive application of drying and wetting steps, enhancing the chemical and physical phenomena on the mineral or concentrate, thus provoking the crystallization, recrystallization, and release of copper in a non-stoichiometric decomposition of the sulfide and its subsequent precipitation with chloride. The invention is made up of 3 steps called: (a) Wetting, (b) Drying and Oversaturation, (c) Washing and re-wetting, and these are conducted at temperatures ranging from 20-40° C. regardless of the redox potential with a minimum consumption of water and acid without requiring the addition of oxygen. The method allows diminishing the water and acid consumption, since the transformation of the sulfide can be carried out only in the presence of hydrated salts and/or the minimal addition of acid and water.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: December 31, 2024
    Assignee: NOVA MINERALIS S.A.
    Inventor: Rodrigo Andrés Cortés Cortés
  • Publication number: 20240424467
    Abstract: A system and method including an oxidative dehydrogenation (ODH) reactor system, feeding ethane and oxygen to an ODH reactor having ODH catalyst, and dehydrogenating ethane to ethylene via the ODH catalyst in presence of the oxygen in the ODH reactor, thereby forming acetic acid in the ODH reactor. The ODH reactor effluent is discharged through a quench heat exchanger, thereby cooling the effluent via the quench heat exchanger to below a temperature threshold, the effluent including ethylene, acetic acid, water, carbon dioxide, carbon monoxide, and unreacted ethane, wherein residence time of the effluent from the ODH reactor to effluent discharge outlet of the quench heat exchanger is less than a specified upper limit.
    Type: Application
    Filed: August 16, 2022
    Publication date: December 26, 2024
    Applicant: NOVA CHEMICALS (INTERNATIONAL) S.A.
    Inventors: Bolaji OLAYIWOLA, Vasily SIMANZHENKOV, Shahin GOODARZNIA
  • Patent number: 12177493
    Abstract: Certain examples described herein relate to methods for encoding and decoding signals. Certain examples relate to the control of signal processing operations that are performed at a decoder. These may comprise optional signal processing operations to provide an enhanced output signal. For video signals, the enhanced output signal may comprise a so-called “super-resolution” signal, e.g. a signal with improved detail resolution as compared to a reference signal. Certain examples described herein provide signalling for enhancement operations, e.g. so-called super-resolution modes, within user data of one or more tier-based hierarchical encoding and decoding schemes. The user data may be embedded within values of an enhancement stream, e.g. replace one or more values for a predefined set of transformed coefficients, and/or within supplementary enhancement information messages. The user data may have a defined syntax including header and payload portions. The syntax may differ for different frames of data, e.g.
    Type: Grant
    Filed: October 2, 2020
    Date of Patent: December 24, 2024
    Assignee: V-Nova International Limited
    Inventors: Simone Ferrara, Guido Meardi
  • Patent number: 12177468
    Abstract: A first level encoded stream is received and decoded to derive a first set of residuals. A first output video comprising an output of a base decoder applied to a base level encoded stream is received. The first set of residuals is combined with the first output video to generate a second output video. The second output video is up-sampled to generate an up-sampled second output video. The up-sampling comprises adding a value derived from an element in the first set of residuals from which a block in the up-sampled second output video was derived to the block in the up-sampled second output video. A second level encoded stream is received and decoded to derive a second set of residuals. The second set of residuals is combined with the up-sampled second output video to generate a reconstructed output video.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: December 24, 2024
    Assignee: V-NOVA INTERNATIONAL LIMITED
    Inventor: Guido Meardi
  • Patent number: 12169049
    Abstract: A support element for a lamp module adapted to precisely accommodate at least one part of the lamp module that comprises an alignment member of the part, wherein the support element comprises at least one alignment member of the element, wherein the alignment member of the part forms, with the alignment member of the element, a pair of specially shaped complementary alignment members adapted to define the relative position of the support element and the given part by tightly fitting a protrusion on one member of the pair into a gap on the other member of the same pair. Furthermore, the object of the invention is a lamp module comprising the support element and a method of lamp module assembly on such a support element.
    Type: Grant
    Filed: November 20, 2023
    Date of Patent: December 17, 2024
    Assignee: Hella Autotechnik Nova S.R.O.
    Inventors: David Machýček, Marek Budiš, Robert Fabián, Jiří Kubíček, Tomas Tempir
  • Patent number: 12168219
    Abstract: This document relates to oxidative dehydrogenation catalyst materials that include molybdenum, vanadium, beryllium, oxygen, and optionally aluminum.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: December 17, 2024
    Assignee: NOVA Chemicals (International) S.A.
    Inventors: Vasily Simanzhenkov, Yoonhee Kim, David Sullivan, Marie Barnes, Elena Sebastiao
  • Patent number: 12163012
    Abstract: A dual reactor solution polymerization process gives polyethylene compositions containing a first ethylene copolymer and a second ethylene copolymer and which has a balance of barrier properties, toughness and environmental resistance. The polyethylene compositions are suitable for end use applications which may benefit from low oxygen transmission rates such as closures for bottles or barrier film.
    Type: Grant
    Filed: January 24, 2020
    Date of Patent: December 10, 2024
    Assignee: NOVA Chemicals (International) S.A.
    Inventor: Xiaochuan Wang
  • Patent number: 12165863
    Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).
    Type: Grant
    Filed: September 18, 2023
    Date of Patent: December 10, 2024
    Assignee: NOVA MEASURING INSTRUMENTS INC.
    Inventors: David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt, Chris Bevis
  • Patent number: 12166987
    Abstract: Computer processor hardware receives a first set of adjustment values. The first set of adjustment values specify adjustments to be made to a predicted rendition of a signal generated at a first level of quality to reconstruct a rendition of the signal at the first level of quality. The computer processor hardware processes the first set of adjustment values and derives a second set of adjustment values based on the first set of adjustment values and a rendition of the signal at a second level of quality. The second level of quality is lower than the first level of quality.
    Type: Grant
    Filed: April 3, 2023
    Date of Patent: December 10, 2024
    Assignee: V-NOVA INTERNATIONAL LIMITED
    Inventors: Luca Rossato, Guido Meardi
  • Patent number: 12165023
    Abstract: A method, a system, and a non-transitory computer readable medium for measuring a local critical dimension uniformity of an array of two-dimensional structural elements, the method may include obtaining an acquired optical spectrometry spectrum of the array; feeding the acquired optical spectrometry spectrum of the array to a trained machine learning process, wherein the trained machine learning process is trained to map an optical spectrometry spectrum to an average critical dimension (CD) and a local critical dimension uniformity (LCDU); and outputting, by the trained machine learning process, the average CD and the LCDU of the array.
    Type: Grant
    Filed: February 23, 2021
    Date of Patent: December 10, 2024
    Assignees: NOVA LTD., INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Dexin Kong, Daniel Schmidt, Aron J. Cepler, Marjorie Cheng, Roy Koret, Igor Turovets
  • Patent number: 12163892
    Abstract: A method, a system, and a non-transitory computer readable medium for accurate Raman spectroscopy. The method may include executing at least one iteration of the steps of: (i) performing, by an optical measurement system, a calibration process that comprises (a) finding a misalignment between a region of interest defined by a spatial filter, and an impinging beam of radiation that is emitted from an illuminated area of a sample, the impinging beam impinges on the spatial filter; and (b) determining a compensating path of propagation of the impinging beam that compensates the misalignment; and (ii) performing a measurement process, while the optical measurement system is configured to provide the compensating path of propagation of the impinging beam, to provide one or more Raman spectra.
    Type: Grant
    Filed: August 18, 2023
    Date of Patent: December 10, 2024
    Assignee: NOVA LTD.
    Inventors: Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov, Gilad Barak
  • Publication number: 20240401940
    Abstract: A system to characterize a film layer within a measurement box is disclosed. The system obtains a first mixing fraction corresponding to a first X-ray beam, the mixing fraction represents a fraction of the first X-ray beam inside a measurement box of a wafer sample, the measurement box represents a bore structure disposed over a substrate and having a film layer disposed inside the bore structure. The system obtains a contribution value for the measurement box corresponding to the first X-ray beam, the contribution value representing a species signal outside the measurement box that contributes to a same species signal inside the measurement box. The system obtains a first measurement detection signal corresponding to a measurement of the measurement box using the first X-ray beam. The system determines a measurement value of the film layer based on the first measurement detection signal, the contribution value, and the first mixing fraction.
    Type: Application
    Filed: May 17, 2024
    Publication date: December 5, 2024
    Applicant: NOVA MEASURING INSTRUMENTS INC.
    Inventors: Heath POIS, Wei Ti LEE, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng, James CHEN, Saurabh Singh
  • Patent number: 12160101
    Abstract: A system for optimizing a network of power plants includes at least one memory storing a network model of a network of power plants and at least one processor. The network model includes a first power plant model of a first power plant including equipment models of power plant equipment of the first power plant, a second power plant model of a second power plant including equipment models of power plant equipment of the second power plant, and a plant relationship between the first power plant and the second power plant. The at least one processor is configured to receive a first input including an augmentation and replacement schedule for the second power plant, receive a second input modifying an attribute of a first equipment model of the first power plant model, and modify the schedule for the second power plant based on the second input and the plant relationship.
    Type: Grant
    Filed: March 7, 2024
    Date of Patent: December 3, 2024
    Assignee: 8ME NOVA, LLC
    Inventors: Lukas Hansen, Gautham Ramesh, Philippe Garneau-Halliday, Kyle Monson, Brandon Carpenter, Rahul Mondal, Emily Arnold
  • Patent number: 12160105
    Abstract: A system for determining power flows in a power plant comprising an energy storage system (ESS) and a power generation system includes at least one memory storing a power plant model of the power plant and at least one processor. The power plant model includes an ESS model including a battery model, a power generation system model, a power price schedule for first and second loads configured to receive power from the power plant, and system relationships between the models. The at least one processor is configured to receive a power demand schedule representing expected power demands from the first load and the second load and determine, based on the power demand schedule, the power price schedule, and the system relationships, a power flow rate forecast for at least one point in the power plant.
    Type: Grant
    Filed: March 7, 2024
    Date of Patent: December 3, 2024
    Assignee: 8ME NOVA, LLC
    Inventors: Elahesadat Naghib, Casey Olives, Jamie Link, Kip Larson
  • Patent number: 12160108
    Abstract: The present disclosure provides systems and methods for flexible renewable energy power generation. The present disclosure also provides systems and methods for firming power generation from multiple renewable energy sources.
    Type: Grant
    Filed: March 28, 2024
    Date of Patent: December 3, 2024
    Assignee: 8ME NOVA, LLC
    Inventors: Gautham Ramesh, Lukas Mercer Hansen, Michael Healy, Thomas Buttgenbach
  • Patent number: 12158437
    Abstract: XPS spectra are used to analyze and monitor various steps in the selective deposition process. A goodness of passivation value is derived to analyze and quantify the quality of the passivation step. A selectivity figure of merit value is derived to analyze and quantify the selectivity of the deposition process, especially for selective deposition in the presence of passivation. A ratio of the selectivity figure of merit to maximum selectivity value can also be used to characterize and monitor the deposition process.
    Type: Grant
    Filed: June 19, 2023
    Date of Patent: December 3, 2024
    Assignee: NOVA MEASURING INSTRUMENTS INC.
    Inventors: Charles Larson, Kavita Shah, Wei T Lee
  • Patent number: 12160601
    Abstract: According to aspects of the invention there is provided a method of encoding an input video into a plurality of encoded streams, wherein the encoded streams may be combined to reconstruct the input video.
    Type: Grant
    Filed: March 19, 2020
    Date of Patent: December 3, 2024
    Assignee: V-NOVA INTERNATIONAL LIMITED
    Inventor: Guido Meardi
  • Publication number: 20240392044
    Abstract: An olefin polymerization process is carried out in the presence of a catalyst system comprising a pre-polymerization catalyst, a boron-based catalyst activator, an alkylaluminoxane co-catalyst, and a hindered phenol compound. The pre-polymerization catalyst is a titanium complex and has an indenoindolyl ligand bridged to a phenoxy ligand via a silyl group. The catalyst system is effective at polymerizing ethylene with alpha-olefins in a solution phase polymerization process at high temperatures and produces ethylene copolymers with high molecular weight and high degrees of alpha-olefin incorporation.
    Type: Application
    Filed: September 16, 2022
    Publication date: November 28, 2024
    Applicant: NOVA CHEMICALS (INTERNATIONAL) S.A.
    Inventors: Darryl MORRISON, Frederick CHIU, James GOETTEL, Xiaoliang GAO, Janelle SMILEY
  • Patent number: 12152869
    Abstract: A method and system are presented for monitoring measurement of parameters of patterned structures based on a predetermined fitting model. The method comprises: (a) providing data indicative of measurements in at least one patterned structure; and (b) applying at least one selected verification mode to said data indicative of measurements, said at least one verification mode comprising: I) analyzing the data based on at least one predetermined factor and classifying the corresponding measurement result as acceptable or unacceptable, II) analyzing the data corresponding to the unacceptable measurement results and determining whether one or more of the measurements providing said unacceptable result are to be disregarded, or whether one or more parameters of the predetermined fitting model are to be modified.
    Type: Grant
    Filed: November 2, 2021
    Date of Patent: November 26, 2024
    Assignee: NOVA LTD.
    Inventors: Boaz Brill, Boris Sherman, Igor Turovets
  • Patent number: 12152993
    Abstract: A method, a system, and a non-transitory computer readable medium for Raman spectroscopy. The method may include determining first acquisition parameters of a Raman spectroscope to provide a first acquisition set-up, the determining is based on at least one expected radiation pattern to be detected by a sensor of the Raman spectroscope as a result of an illumination of a first area of a sample, the first area comprises a first nano-scale structure, wherein at least a part of the at least one expected radiation pattern is indicative of at least one property of interest of the first nano-scale structure of the sample; wherein the first acquisition parameters belong to a group of acquisition parameters; setting the Raman spectroscope according to the first acquisition set-up; and acquiring at least one first Raman spectrum of the first nano-scale structure of the sample, while being set according to the first acquisition set-up.
    Type: Grant
    Filed: September 14, 2021
    Date of Patent: November 26, 2024
    Assignee: NOVA LTD.
    Inventors: Eyal Hollander, Gilad Barak, Elad Schleifer, Yonatan Oren, Amir Shayari