Patents Assigned to Novatia, LLC
  • Patent number: 7230233
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: June 12, 2007
    Assignee: Novatia, LLC
    Inventors: Jeffrey L. Whitney, David J. Detlefsen, Mark E. Hail
  • Publication number: 20070090285
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Application
    Filed: December 6, 2006
    Publication date: April 26, 2007
    Applicant: NOVATIA, LLC
    Inventors: Jeffrey Whitney, David Detlefsen, Mark Hail
  • Publication number: 20060219894
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Application
    Filed: March 21, 2006
    Publication date: October 5, 2006
    Applicant: Novatia, LLC
    Inventors: Jeffrey Whitney, David Detlefsen, Mark Hail
  • Patent number: 7049581
    Abstract: A programmed computer analyzes data from a mass spectrometer. A spectrum corresponding to an unknown sample is perturbed in various ways, and each perturbed spectrum is compared with the spectrum of a known or reference substance. The perturbed spectrum having the highest correlation with the known spectrum, and which is also physically plausible, is considered to be the best fit. The method indicates in what specific ways the unknown sample differs from, or is similar to, the known substance.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: May 23, 2006
    Assignee: Novatia, LLC
    Inventors: Jeffrey L. Whitney, David J. Detlefsen, Mark E. Hail