Abstract: Methods and systems for a compressive optical display and imager using optical scanning and selection and three-dimensional beamforming optics. Standard pixel data can generate a compressed image data set having custom pixel sizes, locations, and intensities. A 3-D beamformer optic adjusts its focus to produce the largest focused beam spot on the display screen corresponding to an image zone compressed pixel. Using scan mirror angular controls, display image space is painted using minimal numbers of laser beam spots whose sizes depend on the compressed sensed image. The imager includes movable reflecting optics to reflect an optical image and controllable imaging optics to pass the reflected optical image toward a digital micromirror that reflects +/?? optical beams into +/? ? optical beam paths. A controller controls reflecting optics and agile front end imaging optics to receive an electronic image signal corresponding to detected +/?? optical beams.

Abstract: Methods, devices and systems of an optical sensor for spatially smart 3-D object measurements using variable focal length lenses to target both specular and diffuse objects by matching transverse dimensions of the sampling optical beam to the transverse size of the flat target for given axial target distance for instantaneous spatial mapping of flat target, zone. The sensor allows volumetric data compressed remote sensing of object transverse dimensions including cross-sectional size, motion transverse displacement, inter-objects transverse gap distance, 3-D animation data acquisition, laser-based 3-D machining, and 3-D inspection and testing. An embodiment provides a 2-D optical display using 2-D laser scanning and 3-D beamforming optics engaged with sensor optics to measure distance of display screen from the laser source and scanning optics by adjusting its focus to produce the smallest focused beam spot on the display screen.

Abstract: Silicon Carbide (SiC) probe designs for extreme temperature and pressure sensing uses a single crystal SiC optical chip encased in a sintered SiC material probe. The SiC chip may be protected for high temperature only use or exposed for both temperature and pressure sensing. Hybrid signal processing techniques allow fault-tolerant extreme temperature sensing. Wavelength peak-to-peak (or null-to-null) collective spectrum spread measurement to detect wavelength peak/null shift measurement forms a coarse-fine temperature measurement using broadband spectrum monitoring. The SiC probe frontend acts as a stable emissivity Black-body radiator and monitoring the shift in radiation spectrum enables a pyrometer. This application combines all-SiC pyrometry with thick SiC etalon laser interferometry within a free-spectral range to form a coarse-fine temperature measurement sensor.

Abstract: An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a light directing element for directing light beams at the etalon and receiving reflected light beams from the etalon wherein the received reflected light beams are used for determining an environmental condition proximate the tip portion. A method for measuring a thickness of the etalon may include directing a light beams at different frequencies at the etalon and receiving the light beams from the etalon. The method may also include identifying conditions of the respective light beams condition received from the etalon and then calculating a first thickness of the etalon responsive to the respective conditions and the known characteristic.

Abstract: A remote temperature sensing system includes a light source selectively producing light at two different wavelengths and a sensor device having an optical path length that varies as a function of temperature. The sensor receives light emitted by the light source and redirects the light along the optical path length. The system also includes a detector receiving redirected light from the sensor device and generating respective signals indicative of respective intensities of received redirected light corresponding to respective wavelengths of light emitted by the light source. The system also includes a processor processing the signals generated by the detector to calculate a temperature of the device.