Abstract: A bottle is moved over a sector of a circular path and simultaneously rotated around its longitudinal axis for the opto-electronic inspection of the mouth area for chipping of the glass. The bottle is guided through the beam path of a measuring apparatus on its way over the circular path. A measuring beam passes at an oblique angle to the longitudinal axis of the bottle in the area of the mouth opening. The location dependent scanning signal generated by the measuring apparatus during each scan corresponding to every discrete angular position of the bottle displays a characteristic intensity modulation. The presence of a chip in the glass may be recognized in the scanning signal by the absence of the intensity maximum present at the location of a chip. The absence of the intensity maximum may be ascertained by measuring the distance between two adjacent intensity maxima and comparing the measured distance with a reference value.

Abstract: An opto-electronic measuring bench for the automatic dimensional inspection of externally turned parts, where the test object is linearly illuminated and an image of two diametrically opposed contour points produced on two rows of photodiodes. The diameter of the shafts may be determined from the position of the images of the two contour points recognized as intensity jumps and the electrically determined distance of the two rows of diodes. The rows of diodes may be moved together with the light sources in the axial direction of the test object, in order to carry out diameter measurements over the entire axial length of the test object. The distance of the diode rows in the axial direction from a starting position is also determined electrically, so that length measurements of the test object are also possible.