Abstract: A wireless device may receive from a first base station, measurement configuration parameters of a measurement of the wireless device. The measurement configuration parameters comprise first beam identifiers of a first plurality of beams, second beam identifiers of a second plurality of beams and a measurement event indicating that a second combined reference signal measurement value of the second plurality of beams exceeds a first combined reference signal measurement value of the first plurality of beams by more than a first offset value. The first plurality of beams and the second plurality of beams are monitored to determine an occurrence of the measurement event. The first base station transmits a measurement report in response to the occurrence of the first measurement event. The measurement report comprises: the first combined reference signal measurement value and the second combined reference signal measurement value.
Type:
Grant
Filed:
May 4, 2018
Date of Patent:
March 31, 2020
Assignee:
Ofinno, LLP
Inventors:
Kyungmin Park, Esmael Dinan, Alireza Babaei, Hyoungsuk Jeon